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Inventor

Chikara Tojima

Inventor
Hadano, JP

Overview

1→
Patents
2000
Patent span
Physics
Primary field (CPC G)

Patents· 1 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions100%
PatentTitleYear
6,025,596'Method for measuring epitaxial film thickness of multilayer epitaxial wafer'2000

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2000Patents assigned to TOSHIBA CERAMICS CO (1)· patent assignee history
2000Based in Hadano, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
TOSHIBA CERAMICS CO12000
Locations
LocationPatentsSpan
Hadano, JP12000