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Inventor

David Berman

Inventor
Kiryat Tivon, IL

Overview

20→
Patents
2003–2020
Patent span
Physics
Primary field (CPC G)

Patents· 20 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties48%
G01BMeasuring length, thickness or similar linear dimensions16%
G01TMeasurement of nuclear or x-radiation13%
A61BDiagnosis6%
A61GTransport, personal conveyances, or accommodation specially adapted for patients or disabled persons3%
B25JManipulators3%
G06FElectric digital data processing3%
G09BEducational or demonstration appliances3%
G16HHealthcare informatics, i.e. information and communication technology [ict] specially adapted for the handling or processing of medical or healthcare data3%
PatentTitleYear
10,524,866Systems and methods for registration of location sensors202010,226,302Systems and methods for providing guidance for a robotic medical procedure20198,731,138'High-resolution X-ray diffraction measurement with enhanced sensitivity'20148,687,766'Enhancing accuracy of fast high-resolution X-ray diffractometry'20148,437,450'Fast measurement of X-ray diffraction from tilted layers'20138,243,878'High-resolution X-ray diffraction measurement with enhanced sensitivity'20127,653,174'Inspection of small features using X-ray fluorescence'20107,649,978'Automated selection of X-ray reflectometry measurement locations'20107,600,916'Target alignment for X-ray scattering measurements'20097,474,732'Calibration of X-ray reflectometry system'20097,453,985'Control of X-ray beam spot size'20087,406,153'Control of X-ray beam spot size'20087,231,016'Efficient measurement of diffuse X-ray reflections'20077,130,376'X-ray reflectometry of thin film layers with enhanced accuracy'20067,068,753'Enhancement of X-ray reflectometry by measurement of diffuse reflections'20067,062,013'X-ray reflectometry of thin film layers with enhanced accuracy'20066,947,520'Beam centering and angle calibration for X-ray reflectometry'20056,895,071'XRR detector readout processing'20056,639,968'X-ray reflectometer'20036,512,814'X-ray reflectometer'2003

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2003–2009Patents assigned to JORDAN VALLEY APPLIED RADIATION LTD (8)· patent assignee history
2003–2014Based in Kiryat Tivon, IL· patent location history
2008–2014Patents assigned to JORDAN VALLEY SEMICONDUCTORS (8)· patent assignee history
2012–2014Patents assigned to BERMAN DAVID (4)· patent assignee history
2012–2014Patents assigned to WORMINGTON MATTHEW (4)· patent assignee history
2012–2014Patents assigned to KROHMAL ALEXANDER (3)· patent assignee history
2019Based in Miami, FL, US· patent location history
2020Based in Millbrae, CA, US· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
JORDAN VALLEY APPLIED RADIATION LTD82003–2009
JORDAN VALLEY SEMICONDUCTORS82008–2014
BERMAN DAVIDself42012–2014
WORMINGTON MATTHEW42012–2014
KROHMAL ALEXANDER32012–2014
Locations
LocationPatentsSpan
Kiryat Tivon, IL182003–2014
Millbrae, California, US12020
Miami, Florida, US12019