Inventor

Ming-Hsiang Song

Inventor
Shin-Chu, TW

Overview

54→
Patents
2006–2020
Patent span
Electricity
Primary field (CPC H)

Patents· 54 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H10Dprimary
H10DInorganic electric semiconductor devices40%
H01LSemiconductor devices28%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1010%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h106%
H02HEmergency protective circuit arrangements4%
G11CStatic stores3%
G01RMeasuring electric variables2%
G06FElectric digital data processing2%
H03KPulse technique2%
H10BElectronic memory devices2%
PatentTitleYear
10,803,967Memory device with a fuse protection circuit202010,790,274SCRs with checker board layouts202010,756,082Method of forming electrostatic discharge (ESD) testing structure202010,741,543Device including integrated electrostatic discharge protection component202010,643,726Memory device with a fuse protection circuit202010,325,906ESD testing structure, method of using same and method of forming same201910,283,210Memory device with a fuse protection circuit201910,269,986Rotated STI diode on FinFET technology201910,109,366Memory device with a fuse protection circuit201810,096,589Fin ESD protection diode and fabrication method thereof20189,979,186Electrostatic discharge protection for three dimensional integrated circuit20189,978,739Semiconductor arrangement facilitating enhanced thermo-conduction20189,882,002'FinFET with an asymmetric source/drain structure and method of making same'20189,842,833'Electrostatic discharge protection'20179,831,235Method of making structure having a gate stack20179,812,436'SCRs with checker board layouts'20179,666,575'Semiconductor arrangement facilitating enhanced thermo-conduction'20179,647,452'Electrostatic discharge protection for level-shifter circuit'20179,576,949'Diode formed of PMOSFET and schottky diodes'20179,576,945'Methods and apparatus for increased holding voltage in silicon controlled rectifiers for ESD protection'20179,466,978'Electrostatic discharge protection for level-shifter circuit'20169,443,850'Epitaxial growth between gates'20169,443,840'Methods and apparatus for ESD structures'20169,425,247'Metal-insulator-metal capacitor with current leakage protection'20169,397,217'Contact structure of non-planar semiconductor device'20169,318,621'Rotated STI diode on FinFET technology'20169,245,878'Bidirectional dual-SCR circuit for ESD protection'20169,231,106'FinFET with an asymmetric source/drain structure and method of making same'20169,230,961'Semiconductor arrangement facilitating enhanced thermo-conduction'20169,178,008'Metal-insulator-metal capacitor with current leakage protection'20159,172,242'Electrostatic discharge protection for three dimensional integrated circuit'20159,147,676'SCRs with checker board layouts'20159,130,008'Robust ESD protection with silicon-controlled rectifier'20159,117,669'Apparatus for ESD protection'20158,963,200'Methods and apparatus for increased holding voltage in silicon controlled rectifiers for ESD protection'20158,940,596'Method of making structure having a gate stack'20158,921,943'Methods and apparatus for ESD structures'20148,906,767'Semiconductor device with self-aligned interconnects'20148,779,518'Apparatus for ESD protection'20148,759,871'Bidirectional dual-SCR circuit for ESD protection'20148,730,626'Electrostatic discharge protection'20148,692,289'Fast turn on silicon controlled rectifiers for ESD protection'20148,610,220'Semiconductor device with self-aligned interconnects'20138,587,074'Device having a gate stack'20138,493,705'Electrostatic discharge circuit for radio frequency transmitters'20138,405,943'Circuit and method for power clamp triggered dual SCR ESD protection'20138,324,658'ESD protection circuit for RFID tag'20128,079,528'Input/output pads placement for a smart card chip'20118,049,250'Circuit and method for power clamp triggered dual SCR ESD protection'20117,500,214'System and method for reducing design cycle time for designing input/output cells'20097,420,250'Electrostatic discharge protection device having light doped regions'20087,411,767'Multi-domain ESD protection circuit structure'20087,323,752'ESD protection circuit with floating diffusion regions'20087,062,740'System and method for reducing design cycle time for designing input/output cells'2006

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2006–2016Patents assigned to TAIWAN SEMICONDUCTOR MFG (27)· patent assignee history
2006–2020Based in Shin-Chu, TW· patent location history
2008–2020Based in Hsinchu, TW· patent location history
2011–2017Patents assigned to SONG MING-HSIANG (12)· patent assignee history
2013–2017Patents assigned to LEE JAM-WEM (5)· patent assignee history
2014–2015Patents assigned to CHANG TZU-HENG (4)· patent assignee history
2015–2020Patents assigned to TAIWAN SEMICONDUCTOR MFG CO LTD (27)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
TAIWAN SEMICONDUCTOR MFG272006–2016
TAIWAN SEMICONDUCTOR MFG CO LTD272015–2020
SONG MING-HSIANGself122011–2017
LEE JAM-WEM52013–2017
CHANG TZU-HENG42014–2015
Locations
LocationPatentsSpan
Shin-Chu, TW402006–2020
Hsinchu, TW142008–2020