Inventor
Junko Konishi
Inventor
Yokohama, JP
Overview
Patents· 12 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G06Tprimary
G06TImage data processing or generation, in general25%
G01NInvestigating or analysing materials by determining their chemical or physical properties17%
G06FElectric digital data processing17%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1013%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices8%
G06VImage or video recognition or understanding8%
G05BControl or regulating systems in general4%
H01JElectric discharge tubes or discharge lamps4%
Y02PClimate change mitigation technologies in the production or processing of goods4%
PatentTitleYear
9,020,237'Method for optimizing observed image classification criterion and image classification apparatus'20158,892,494'Device for classifying defects and method for adjusting classification'20148,779,360'Charged particle beam device, defect observation device, and management server'20148,625,906'Image classification standard update method, program, and image classification device'20148,472,696'Observation condition determination support device and observation condition determination support method'20138,428,336'Inspecting method, inspecting system, and method for manufacturing electronic devices'20138,290,241'Analyzing apparatus, program, defect inspection apparatus, defect review apparatus, analysis system, and analysis method'20128,209,135'Wafer inspection data handling and defect review tool'20128,043,772'Manufacturing method and manufacturing system of semiconductor device'20117,424,336'Test data analyzing system and test data analyzing program'20087,068,834'Inspecting method, inspecting system, and method for manufacturing electronic devices'20066,611,728'Inspection system and method for manufacturing electronic devices using the inspection system'2003Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2003–2013Patents assigned to HITACHI LTD (3)· patent assignee history
2003–2014Based in Yokohama, JP· patent location history
2008–2015Patents assigned to HITACHI HIGH TECH CORP (8)· patent assignee history
2012–2015Patents assigned to KONISHI JUNKO (8)· patent assignee history
2012–2014Patents assigned to FUNAKOSHI TOMOHIRO (4)· patent assignee history
2013–2015Based in Hitachinaka, JP· patent location history
2014–2015Patents assigned to HIRAI TAKEHIRO (3)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI HIGH TECH CORP | 8 | 2008–2015 |
| KONISHI JUNKOself | 8 | 2012–2015 |
| FUNAKOSHI TOMOHIRO | 4 | 2012–2014 |
| HIRAI TAKEHIRO | 3 | 2014–2015 |
| HITACHI LTD | 3 | 2003–2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Yokohama, JP | 8 | 2003–2014 |
| Hitachinaka, JP | 4 | 2013–2015 |