Inventor
Hung-Wei Lai
Inventor
Hsinchu County, TW
Overview
Patents· 4 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables44%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1033%
H01LSemiconductor devices11%
H04BTransmission11%
PatentTitleYear
9,952,277Test device and method using single probe to test multiple pads of chip20189,945,900Testing device for radio frequency front end and radio frequency front end testing method20189,506,974'Active probe card'20169,435,863'Integrated circuit testing interface on automatic test equipment'2016Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2016Patents assigned to SITRONIX TECHNOLOGY CORP (2)· patent assignee history
2016–2018Based in Hsinchu County, TW· patent location history
2018Patents assigned to SYNC TECH SYSTEM CORP (1)· patent assignee history
2018Patents assigned to UNIVERSAL SCIENT INDUSTRIAL SHANGHAI CO LTD (1)· patent assignee history
2018Based in Shanghai, CN· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SITRONIX TECHNOLOGY CORP | 2 | 2016 |
| SYNC TECH SYSTEM CORP | 1 | 2018 |
| UNIVERSAL SCIENT INDUSTRIAL SHANGHAI CO LTD | 1 | 2018 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hsinchu County, TW | 3 | 2016–2018 |
| Shanghai, CN | 1 | 2018 |