Inventor
Yuji Kasai
Inventor
Tsukuba, JP
Overview
Patents· 32 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps9%
H01LSemiconductor devices8%
G01NInvestigating or analysing materials by determining their chemical or physical properties7%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h107%
B25JManipulators5%
B65GTransport or storage devices, e.g. conveyors for loading or tipping, shop conveyor systems or pneumatic tube conveyors5%
H04LTransmission of digital information, e.g. telegraphic communication5%
G01RMeasuring electric variables4%
H04BTransmission4%
H10BElectronic memory devices4%
PatentTitleYear
11,118,034Tire202111,088,252Three-dimensional memory device with a silicon carbon nitride interfacial layer in a charge storage layer and methods of making the same202111,049,807Three-dimensional memory device containing tubular blocking dielectric spacers202111,024,645Three-dimensional memory device containing a silicon nitride ring in an opening in a memory film and method of making the same202111,008,180Swirl flow-forming body and suction device202110,654,654Suction device202010,643,881Baffle plate202010,217,604Charged particle beam apparatus201910,189,166Suction equipment20199,368,319'Method for removing foreign substances in charged particle beam device, and charged particle beam device'20168,982,926'Spectrum spread communication system'20158,890,068'Charged particle ray apparatus and pattern measurement method'20148,686,380'Charged particle beam apparatus'20148,493,991'Serial bus transmission system'20137,583,749'Digital data transmitting apparatus'20097,529,528'Power consumption controlling apparatus for high frequency amplifier'20097,514,683'Scanning electron microscope'20097,447,289'Signal timing adjustment device, signal timing adjustment system, signal timing adjustment amount setting program, and storage medium storing the program'20087,397,031'Method of inspecting a circuit pattern and inspecting instrument'20087,295,032'High-speed signal transmission system'20077,274,238'Digital circuit having delay circuit for adjustment of clock signal timing'20077,248,095'Bus driver with well voltage control section'20077,098,455'Method of inspecting a circuit pattern and inspecting instrument'20066,879,388'Optical apparatus, optical apparatus adjustment method, and storage medium recorded with a processing program that executes said adjustment method'20056,861,848'Capacitance position sensor and position controller equipped with the sensor'20056,844,739'Maximum power point tracking method and device'20056,781,682'Optical apparatus, optical apparatus adjustment method, and storage medium recorded with a processing program that executes said adjustment method'20046,637,008'Electronic holding circuit and adjusting method thereof using a probabilistic searching technique'20036,583,413'Method of inspecting a circuit pattern and inspecting instrument'20036,441,394'Intrinsic Josephson superconducting tunnel junction device'20025,886,778'Method of measuring atomic beam flux rate in film growth apparatus'19994,957,196'Coin-operated locker'1990Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1990–2019Based in Tokyo, JP· patent location history
1999–2005Patents assigned to AGENCY IND SCIENCE TECHN (4)· patent assignee history
1999–2013Based in Tsukuba, JP· patent location history
2002–2015Patents assigned to NAT INST OF ADVANCED IND SCIEN (10)· patent assignee history
2003–2014Based in Hitachinaka, JP· patent location history
2004–2015Based in Ibaraki, JP· patent location history
2005–2015Patents assigned to KASAI YUJI (5)· patent assignee history
2009–2019Patents assigned to HITACHI HIGH TECH CORP (5)· patent assignee history
2019–2021Patents assigned to HARMOTEC CO LTD (4)· patent assignee history
2019–2021Based in Kofu, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| NAT INST OF ADVANCED IND SCIEN | 10 | 2002–2015 |
| HITACHI HIGH TECH CORP | 5 | 2009–2019 |
| KASAI YUJIself | 5 | 2005–2015 |
| AGENCY IND SCIENCE TECHN | 4 | 1999–2005 |
| HARMOTEC CO LTD | 4 | 2019–2021 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tsukuba, JP | 10 | 1999–2013 |
| Hitachinaka, JP | 5 | 2003–2014 |
| Kofu, JP | 4 | 2019–2021 |
| Tokyo, JP | 4 | 1990–2019 |
| Ibaraki, JP | 4 | 2004–2015 |