Inventor
Timothy R. Tiemeyer
Inventor
Providence, RI, US
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties38%
G06TImage data processing or generation, in general25%
Y10TTechnical subjects covered by former us classification25%
G06FElectric digital data processing6%
G06VImage or video recognition or understanding6%
PatentTitleYear
9,103,800'System with multiple scattered light collectors'20158,497,984'System and method for inspection of a workpiece surface using multiple scattered light collectors'20138,260,035'Threshold determination in an inspection system'20127,505,125'System and method for signal processing for a workpiece surface inspection system'20097,286,218'System and method for inspecting a workpiece surface using surface structure spatial frequencies'20077,280,200'Detection of a wafer edge using collimated light'2007Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2007Patents assigned to ADE CORP (1)· patent assignee history
2007Patents assigned to KLA TENCOR TECH CORP (1)· patent assignee history
2007–2015Based in Providence, RI, US· patent location history
2007Based in Randolph, MA, US· patent location history
2009–2015Patents assigned to KLA TENCOR CORP (4)· patent assignee history
2013Patents assigned to BILLS RICHARD EARL (1)· patent assignee history
2013Patents assigned to JUDELL NEIL (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| KLA TENCOR CORP | 4 | 2009–2015 |
| ADE CORP | 1 | 2007 |
| BILLS RICHARD EARL | 1 | 2013 |
| JUDELL NEIL | 1 | 2013 |
| KLA TENCOR TECH CORP | 1 | 2007 |
Locations
| Location | Patents | Span |
|---|---|---|
| Providence, RI, US | 5 | 2007–2015 |
| Randolph, Massachusetts, US | 1 | 2007 |