Inventor
Ken Sato
Inventor
Miyoshi, JP
Overview
Patents· 90 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Dprimary
H10DInorganic electric semiconductor devices18%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1010%
H01LSemiconductor devices8%
A61BDiagnosis7%
H04QSelecting6%
H04JMultiplex communication6%
C30BSingle-crystal growth3%
G02BOptical elements, systems or apparatus2%
H10NElectric solid-state devices not otherwise provided for2%
C23CCoating metallic material2%
PatentTitleYear
11,037,495Device and method for controlling a self-luminous display panel202110,842,359Curvature sensor and endoscope apparatus equipped with the same202010,833,184Semiconductor device substrate, semiconductor device, and method for manufacturing semiconductor device substrate202010,813,701System, method and computer program product for bend information estimation202010,806,231Drawing apparatus, drawing method, and recording medium storing program202010,805,698Optical cross-connect device202010,729,313Bend information computation apparatus, endoscope system including bend information computation apparatus, bend information computation method, and program for bend information computation202010,586,701Semiconductor base having a composition graded buffer layer stack202010,571,253Shape estimation device, endoscope system including shape estimation device, shape estimation method, and program for shape estimation202010,553,674Substrate for semiconductor device, semiconductor device, and method for manufacturing semiconductor device202010,529,842Semiconductor base substance having a boron containing buffer layer, semiconductor device including the same, and methods for manufacturing the semiconductor base substance and the semiconductor device202010,448,128Optical switch device201910,319,587Method of manufacturing epitaxial wafer and silicon-based substrate for epitaxial growth201910,197,386Bend information computation apparatus201910,123,100Optical network201810,115,589Epitaxial substrate for electronic devices, electronic device, method for producing the epitaxial substrate for electronic devices, and method for producing the electronic device201810,068,985Method for manufacturing semiconductor substrate, method for manufacturing semiconductor device, semiconductor substrate, and semiconductor device201810,034,654Ultrasound unit and ultrasound endoscope201810,016,120Curvature sensor and endoscope apparatus20189,966,259Silicon-based substrate, semiconductor device, and method for manufacturing semiconductor device20189,938,638Method for producing semiconductor epitaxial wafer and semiconductor epitaxial wafer20189,876,101Semiconductor substrate and semiconductor device20189,788,089'Optical cross-connect'20179,757,009'In vivo information acquiring apparatus'20179,673,052'Silicon-based substrate having first and second portions'20179,654,851'Optical cross-connect device'20179,520,286'Semiconductor substrate, semiconductor device and method of manufacturing the semiconductor device'20169,496,979'Space switch device'20169,480,117'Control system for controlling a load via power-line communications'20169,401,420'Semiconductor device'20169,282,880'Wireless power supply apparatus, power transmission coil unit, and wireless power supply system'20169,281,187'Method for manufacturing nitride semiconductor device'20169,172,488'Optical terminating apparatus for optical path network'20159,087,890'Semiconductor device'20159,084,033'Optical cross-connect apparatus'20159,081,229'Surface light source unit, surface illumination device, and liquid crystal display device'20159,062,848'Light source device and illumination device including the light source device'20158,915,840'Capsule-type medical device, power supply apparatus, and power supply system'20148,690,380'Surface illumination method using point light source, linear light source device, and surface illumination device using linear light source device'20148,663,094'In-vivo information acquiring system'20148,652,949'Method of manufacturing semiconductor wafer'20148,564,021'Semiconductor device and its manufacturing method'20138,563,984'Semiconductor device'20138,558,280'Semiconductor device and method of manufacturing the semiconductor device'20138,546,848'Nitride semiconductor device'20138,524,550'Method of manufacturing semiconductor device and semiconductor device'20138,496,576'In-vivo information acquiring system and method for controlling in-vivo information acquiring system'20138,487,346'Semiconductor device'20138,410,525'Compound semiconductor substrate and device therewith'20138,384,089'Nitride semiconductor device and method of manufacturing the same'20138,326,143'Routing method of optical communication network node apparatus and optical communication network node apparatus'20128,300,778'Information processing terminal device and method for notifying missed call or unread E-mail'20128,264,001'Semiconductor wafer having multi-layered buffer region formed from compound semiconductor materials'20128,247,842'Nitride semiconductor device having graded aluminum content'20128,244,133'Optical waveband demultiplexer, optical waveband multiplexer, and optical waveband selective switch'20128,228,493'Carrying device and appearance inspection device for test objects'20128,193,561'Semiconductor device and method of manufacturing the same'20128,164,117'Nitride semiconductor device'20128,159,004'Compound semiconductor device having dopant concentration gradient'20128,154,593'Appearance inspection device'20128,143,650'Semiconductor device having resistance layer formed on side surface of semiconductor layer'20128,123,024'Vibrating feeder, carrying device and inspection device'20127,989,816'Semiconductor device'20117,868,355'Hetero field effect transistor and manufacturing method thereof'20117,859,017'Normally-off field-effect semiconductor device'20107,838,906'Semiconductor device and method of manufacturing the same'20107,777,254'Normally-off field-effect semiconductor device'20107,777,253'Field-effect semiconductor device'20107,615,452'Method of fabrication of normally-off field-effect semiconductor device'20097,483,446'Packet transmission device and packet transmission system'20097,266,165'Code distinguishing apparatus'20076,753,190'Immunologic test method and immunologic test kit'20046,731,876'Packet transmission device and packet transmission system'20046,354,087'Method and apparatus for cooling superconductor'20026,337,307'Oxide superconducting conductor with intermediate layer having aligned crystal orientation'20026,276,048'Method of producing oxide superconductor'20016,038,354'Optical modulator having a reflection plate mounted on a reflection end with an inclined angle against the reflection end'20005,820,358'Clearance means to prevent fuel leakage in a radial piston pump'19985,754,320'Optical cross-connect system'19985,639,714'Method of producing oxide superconductor'19975,630,708'Radial piston pump for low-viscosity fuel'19975,583,058'Infrared detection element array and method for fabricating the same'19965,262,398'Ceramic oxide superconductive composite material'19934,956,742'Switch gear'19904,697,320'Roll for a rolling mill, method of producing the same and the rolling mill incorporating the roll'19874,646,724'Endoscopic photographing apparatus'19874,604,992'Endoscope system'19864,561,429'Flashlight control apparatus for endoscope'19854,556,609'Heat-resistant galvanized iron alloy wire'19853,952,571'Method of manufacturing aluminum conductor wires'1976Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1976–2002Patents assigned to SUMITOMO ELECTRIC INDUSTRIES (7)· patent assignee history
1998–2015Based in Saitama, JP· patent location history
2009–2020Patents assigned to SANKEN ELECTRIC CO LTD (34)· patent assignee history
2010–2013Based in Niiza, JP· patent location history
2012–2016Patents assigned to SATO KEN (28)· patent assignee history
2012–2020Based in Nagoya, JP· patent location history
2013–2020Patents assigned to OLYMPUS CORP (12)· patent assignee history
2014–2020Based in Hachioji, JP· patent location history
2016–2020Patents assigned to SHINETSU HANDOTAI KK (14)· patent assignee history
2016–2020Based in Miyoshi, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SANKEN ELECTRIC CO LTD | 34 | 2009–2020 |
| SATO KENself | 28 | 2012–2016 |
| SHINETSU HANDOTAI KK | 14 | 2016–2020 |
| OLYMPUS CORP | 12 | 2013–2020 |
| SUMITOMO ELECTRIC INDUSTRIES | 7 | 1976–2002 |
Locations
| Location | Patents | Span |
|---|---|---|
| Miyoshi, JP | 14 | 2016–2020 |
| Saitama, JP | 14 | 1998–2015 |
| Hachioji, JP | 10 | 2014–2020 |
| Nagoya, JP | 10 | 2012–2020 |
| Niiza, JP | 10 | 2010–2013 |