Inventor
John Pasiecznik, Jr.
Inventor
Malibu, CA, US
Overview
Patents· 18 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables23%
E05FDevices for moving wings into open or closed position13%
E05YIndexing scheme associated with subclasses e05d and e05f, relating to construction elements, electric control, power supply, power signal or transmission, user interfaces, mounting or coupling, details, accessories, auxiliary operations not otherwise provided for, application thereof13%
H03KPulse technique10%
H01GCapacitors8%
H01PWaveguides8%
H03JTuning resonant circuits8%
H04BTransmission5%
Y10TTechnical subjects covered by former us classification5%
G01SRadio direction-finding3%
PatentTitleYear
7,546,146'Control system and method for diversity antenna system'20097,400,488'Variable capacitance membrane actuator for wide band tuning of microstrip resonators and filters'20087,161,791'Variable capacitance membrane actuator for wide band tuning of microstrip resonators and filters'20077,151,350'Powered door object detection system and method'20067,085,121'Variable capacitance membrane actuator for wide band tuning of microstrip resonators and filters'20066,777,958'Method and apparatus for detecting a change in capacitance of a capacitive proximity sensor'20046,750,624'Non-contact obstacle detection system utilizing ultra sensitive capacitive sensing'20046,723,933'Flexible capacitive strip for use in a non-contact obstacle detection system'20046,700,393'Capacitive sensor assembly for use in a non-contact obstacle detection system'20046,014,108'Transverse-folded scanning antennas'20005,872,459'Method of testing integrated circuits'19995,642,054'Active circuit multi-port membrane probe for full wafer testing'19975,623,214'Multiport membrane probe for full-wafer testing'19975,600,256'Cast elastomer/membrane test probe assembly'19975,412,866'Method of making a cast elastomer/membrane test probe assembly'19955,313,157'Probe for jesting an electrical circuit chip'19945,148,103'Apparatus for testing integrated circuits'19924,803,644'Alignment mark detector for electron beam lithography'1989Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1989–2004Patents assigned to HUGHES AIRCRAFT CO (9)· patent assignee history
1989–2009Based in Malibu, CA, US· patent location history
2000Patents assigned to HUGHES ELECTRONICS CORP (1)· patent assignee history
2004–2006Patents assigned to DELPHI TECH INC (4)· patent assignee history
2006–2008Patents assigned to HRL LAB LLC (3)· patent assignee history
2009Patents assigned to GM GLOBAL TECH OPERATIONS INC (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HUGHES AIRCRAFT CO | 9 | 1989–2004 |
| DELPHI TECH INC | 4 | 2004–2006 |
| HRL LAB LLC | 3 | 2006–2008 |
| GM GLOBAL TECH OPERATIONS INC | 1 | 2009 |
| HUGHES ELECTRONICS CORP | 1 | 2000 |
Locations
| Location | Patents | Span |
|---|---|---|
| Malibu, California, US | 18 | 1989–2009 |