Inventor
Israel Wagner
Inventor
Haifa, IL
Overview
Patents· 35 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
C23Cprimary
C23CCoating metallic material18%
H01JElectric discharge tubes or discharge lamps18%
G06FElectric digital data processing17%
G11CStatic stores10%
H03KPulse technique10%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h105%
H03MCoding3%
B24BMachines, devices, or processes for grinding or polishing2%
C23FNon-mechanical removal of metallic material from surface2%
G01RMeasuring electric variables2%
PatentTitleYear
10,825,543Locating failures in memory with redundancy202010,756,707Area-efficient dynamic capacitor circuit for noise reduction in VLSI circuits20209,825,619'Self-timed, log-space, voltage-controlled delay line'20179,466,358'Structure for static random access memory'20169,465,905'Structure for static random access memory'20169,343,182'Direct memory based ring oscillator (DMRO) for on-chip evaluation of SRAM cell delay and stability'20169,299,458'Voltage comparator circuit and usage thereof'20169,263,096'Voltage comparator circuit and usage thereof'20168,330,548'Latched ring oscillator device for on-chip measurement of clock to output delay in a latch'20128,273,221'Sputter target utilization'20128,161,427'Logic circuit and method of logic circuit design'20127,994,846'Method and mechanism to reduce current variation in a current reference branch circuit'20117,962,539'System, method and device of generating a random value'20117,943,016'Magnetron sputtering apparatus'20117,941,471'Differential approach to current-mode chaos based random number generator'20117,825,693'Reduced duty cycle distortion using controlled body device'20107,716,625'Logic circuit and method of logic circuit design'20107,345,511'Logic circuit and method of logic circuit design'20087,215,341'Memory free method of region filling'20076,744,395'Power-scalable asynchronous architecture for a wave-pipelined analog to digital converter'20046,658,368'On-chip histogram testing'20036,623,606'Method and apparatus for sputter coating with variable target to substrate spacing'20036,577,649'Multiplexer for asynchronous data'20036,566,934'Charge cancellation circuit for switched capacitor applications'20036,420,663'One layer spider interconnect'20026,416,635'Method and apparatus for sputter coating with variable target to substrate spacing'20025,958,134'Process equipment with simultaneous or sequential deposition and etching capabilities'19995,894,419'System and method for robust clocking schemes for logic circuits'19995,415,753'Stationary aperture plate for reactive sputter deposition'19955,409,590'Target cooling and support for magnetron sputter coating apparatus'19955,130,005'Magnetron sputter coating method and apparatus with rotating magnet cathode'19925,126,028'Sputter coating process control method and apparatus'19925,080,772'Method of improving ion flux distribution uniformity on a substrate'19924,957,605'Method and apparatus for sputter coating stepped wafers'19904,871,433'Method and apparatus for improving the uniformity ion bombardment in a magnetron sputtering system'1989Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1989–1995Patents assigned to MATERIALS RESEARCH CORP (7)· patent assignee history
1989–2003Based in Monsey, NY, US· patent location history
1999–2020Patents assigned to IBM (19)· patent assignee history
1999–2003Patents assigned to TOKYO ELECTRON LTD (3)· patent assignee history
1999–2017Based in Haifa, IL· patent location history
2007–2012Patents assigned to TECHNION RES & DEV FOUNDATION (4)· patent assignee history
2010–2020Based in Zichron Yaakov, IL· patent location history
2010–2012Based in Zikhron-Yaakov, IL· patent location history
2011–2012Based in Sargans, CH· patent location history
2012Patents assigned to WAGNER ISRAEL A (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 19 | 1999–2020 |
| MATERIALS RESEARCH CORP | 7 | 1989–1995 |
| TECHNION RES & DEV FOUNDATION | 4 | 2007–2012 |
| TOKYO ELECTRON LTD | 3 | 1999–2003 |
| WAGNER ISRAEL Aself | 2 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Haifa, IL | 13 | 1999–2017 |
| Monsey, New York, US | 10 | 1989–2003 |
| Zichron Yaakov, IL | 7 | 2010–2020 |
| Sargans, CH | 2 | 2011–2012 |
| Zikhron-Yaakov, IL | 2 | 2010–2012 |