Inventor
J. Christian Swindal
Inventor
Ridgefield, CT, US
Overview
Patents· 3 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions50%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices17%
H01LSemiconductor devices17%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1017%
PatentTitleYear
9,506,743'Position measuring apparatus, position measuring method, lithographic apparatus and device manufacturing method'2016RE044434'Optical position measuring system and method using a low coherence light source'20137,573,580'Optical position measuring system and method using a low coherence light source'2009Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2009–2016Patents assigned to ASML HOLDING NV (3)· patent assignee history
2009–2016Based in Ridgefield, CT, US· patent location history
2013Patents assigned to SWINDAL J CHRISTIAN (1)· patent assignee history
2016Patents assigned to ASML NETHERLANDS BV (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ASML HOLDING NV | 3 | 2009–2016 |
| ASML NETHERLANDS BV | 1 | 2016 |
| SWINDAL J CHRISTIANself | 1 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Ridgefield, CT, US | 3 | 2009–2016 |