Inventor
Kelly J. Bruland
Inventor
Portland, OR, US
Overview
Patents· 35 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
B23Kprimary
B23KSoldering or unsoldering33%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1020%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1011%
G11CStatic stores5%
H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light5%
G02BOptical elements, systems or apparatus4%
H10DInorganic electric semiconductor devices4%
H01JElectric discharge tubes or discharge lamps3%
G16ZInformation and communication technology [ict] specially adapted for specific application fields, not otherwise provided for2%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests2%
PatentTitleYear
10,830,586Confocal chromatic sensor systems20209,991,090Dual laser beam system used with an electron microscope and FIB20189,821,486'Integrated lamellae extraction station'20178,598,490'Methods and systems for laser processing a workpiece using a plurality of tailored laser pulse shapes'20138,526,473'Methods and systems for dynamically generating tailored laser pulses'20138,515,701'Method for detecting particulate contamination under a workpiece'20138,497,450'On-the fly laser beam path dithering for enhancing throughput'20138,383,982'Methods and systems for semiconductor structure processing using multiple laser beam spots'20138,358,671'Photonic clock stabilized laser comb processing'20138,278,595'Use of predictive pulse triggering to improve accuracy in link processing'20128,238,007'On-the-fly laser beam path error correction for specimen target location processing'20128,178,818'Photonic milling using dynamic beam arrays'20128,148,211'Semiconductor structure processing using multiple laser beam spots spaced on-axis delivered simultaneously'20128,110,775'Systems and methods for distinguishing reflections of multiple laser beams for calibration for semiconductor structure processing'20128,076,605'Systems and methods for adapting parameters to increase throughput during laser-based wafer processing'20118,049,135'Systems and methods for alignment of laser beam(s) for semiconductor link processing'20118,026,158'Systems and methods for processing semiconductor structures using laser pulses laterally distributed in a scanning window'20117,982,160'Photonic clock stabilized laser comb processing'20117,964,819'Methods and systems for positioning a laser beam spot relative to a semiconductor integrated circuit using a processing target as a metrology target'20117,935,941'Semiconductor structure processing using multiple laser beam spots spaced on-axis on non-adjacent structures'20117,923,306'Semiconductor structure processing using multiple laser beam spots'20117,760,331'Decoupled, multiple stage positioning system'20107,687,740'Semiconductor structure processing using multiple laterally spaced laser beam spots delivering multiple blows'20107,633,034'Semiconductor structure processing using multiple laser beam spots overlapping lengthwise on a structure'20097,629,234'Semiconductor structure processing using multiple laterally spaced laser beam spots with joint velocity profiling'20097,608,800'Methods and systems for decreasing the effective pulse repetition of a laser'20097,435,927'Semiconductor link processing using multiple laterally spaced laser beam spots with on-axis offset'20087,425,471'Semiconductor structure processing using multiple laser beam spots spaced on-axis with cross-axis offset'20087,363,180'Method for correcting systematic errors in a laser processing system'20087,315,038'Methods and systems for positioning a laser beam spot relative to a semiconductor integrated circuit using a processing target as an alignment target'20087,297,972'Methods and systems for positioning a laser beam spot relative to a semiconductor integrated circuit using a processing target as a metrology target'20077,245,412'On-the-fly laser beam path error correction for specimen target location processing'20077,227,098'Method and system for decreasing the effective pulse repetition frequency of a laser'20076,816,294'On-the-fly beam path error correction for memory link processing'20046,181,131'Magnetic resonance force microscopy with oscillator actuation'2001Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2001Based in Seattle, WA, US· patent location history
2004–2013Patents assigned to ELECTRO SCIENT IND INC (29)· patent assignee history
2004–2018Based in Portland, OR, US· patent location history
2011–2013Patents assigned to BRULAND KELLY J (8)· patent assignee history
2011–2013Patents assigned to VANDERGIESSEN CLINT (5)· patent assignee history
2012–2013Patents assigned to BAIRD BRIAN W (5)· patent assignee history
2012–2013Patents assigned to LO HO WAI (5)· patent assignee history
2020Based in Hillsboro, OR, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ELECTRO SCIENT IND INC | 29 | 2004–2013 |
| BRULAND KELLY Jself | 8 | 2011–2013 |
| BAIRD BRIAN W | 5 | 2012–2013 |
| LO HO WAI | 5 | 2012–2013 |
| VANDERGIESSEN CLINT | 5 | 2011–2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Portland, OR, US | 33 | 2004–2018 |
| Hillsboro, OR, US | 1 | 2020 |
| Seattle, Washington, US | 1 | 2001 |