Inventor

Kazuhiko Omote

Inventor

Akiruno, JP

Overview

42→

Patents

2001–2021

Patent span

Physics

Primary field (CPC G)

Patents· 42 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary

G01NInvestigating or analysing materials by determining their chemical or physical properties43%

G21KHandling of particles or ionising radiation not otherwise provided for19%

G01BMeasuring length, thickness or similar linear dimensions9%

A61BDiagnosis4%

H01JElectric discharge tubes or discharge lamps4%

H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h104%

B82YSpecific uses or applications of nanostructures3%

G01TMeasurement of nuclear or x-radiation3%

H05GX-ray technique3%

A01KAnimal husbandry1%

PatentTitleYear

11,131,637Analysis method for fine structure, apparatus, and program2021 11,079,345X-ray inspection device2021 10,983,073Hybrid inspection system2021 10,964,439Soller slit, X-ray diffraction apparatus, and method2021 10,876,978X-ray inspecting device, X-ray thin film inspecting method, and method for measuring rocking curve2020 10,854,348X-ray generator and x-ray analysis device2020 10,598,616X-ray reflectometer2020 10,514,345X-ray thin film inspection device2019 10,473,598X-ray thin film inspection device2019 10,436,723X-ray diffractometer with multilayer reflection-type monochromator2019 10,429,325X-ray small angle optical system2019 10,302,579Grazing incidence x-ray fluorescence spectrometer and grazing incidence x-ray fluorescence analyzing method2019 10,145,808Beam generation unit and X-ray small-angle scattering apparatus2018 9,658,174'X-ray topography apparatus'2017 9,336,917'X-ray apparatus, method of using the same and X-ray irradiation method'2016 9,335,282'X-ray topography apparatus'2016 9,250,199'X-ray imaging apparatus, and X-ray imaging method'2016 9,159,524'X-ray generating apparatus'2015 9,086,367'X-ray intensity correction method and X-ray diffractometer'2015 9,020,101'Target for X-ray generator, method of manufacturing the same and X-ray generator'2015 8,908,830'Surface microstructure measurement method, surface microstructure measurement data analysis method and X-ray scattering measurement device'2014 8,767,918'X-ray scattering measurement device and X-ray scattering measurement method'2014 8,712,013'Motion control system and X-ray measurement apparatus'2014 8,699,663'X-ray image photographing method and X-ray image photographing apparatus'2014 8,085,900'Method for X-ray wavelength measurement and X-ray wavelength measurement apparatus'2011 7,342,997'Method for measuring dead time of X-ray detector'2008 7,257,192'Method and apparatus for X-ray reflectance measurement'2007 7,248,669'Method for analyzing membrane structure and apparatus therefor'2007 7,221,734'Method for X-ray reflectance measurement'2007 7,130,373'Method and apparatus for film thickness measurement'2006 7,116,755'Non-uniform density sample analyzing method, device and system'2006 7,098,459'Method of performing analysis using propagation rays and apparatus for performing the same'2006 7,039,161'Method for analyzing film structure and apparatus therefor'2006 7,035,373'X-ray diffraction apparatus'2006 6,970,532'Method and apparatus for measuring thin film, and thin film deposition system'2005 6,937,694'Pole measuring method'2005 6,920,200'Density-nonuniform multilayer film analyzing method, and apparatus and system thereof'2005 6,873,681'Method of estimating preferred orientation of polycrystalline material'2005 6,459,763'Combinatorial X-ray diffractor'2002 6,385,281'Fluorescent x-ray analyzing method and apprartus'2002 6,307,917'Soller slit and X-ray apparatus'2001 6,249,566'Apparatus for x-ray analysis'2001

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2001–2021Patents assigned to RIGAKU DENKI CO LTD (42)· patent assignee history

2001–2021Based in Tokyo, JP· patent location history

2002–2021Based in Akiruno, JP· patent location history

2005–2019Based in Akishima, JP· patent location history

2011–2016Patents assigned to OMOTE KAZUHIKO (6)· patent assignee history

2014–2016Patents assigned to JIANG LICAI (2)· patent assignee history

2014–2016Patents assigned to VERMAN BORIS (2)· patent assignee history

2014Patents assigned to ITO YOSHIYASU (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
RIGAKU DENKI CO LTD	42	2001–2021
OMOTE KAZUHIKOself	6	2011–2016
JIANG LICAI	2	2014–2016
VERMAN BORIS	2	2014–2016
ITO YOSHIYASU	1	2014

Locations

Location	Patents	Span
Akiruno, JP	20	2002–2021
Tokyo, JP	17	2001–2021
Akishima, JP	5	2005–2019