Inventor
Gregory D. VanWiggeren
Inventor
San Jose, CA, US
Overview
Patents· 30 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties26%
G01MTesting static or dynamic balance of machines or structures20%
G01RMeasuring electric variables11%
G02BOptical elements, systems or apparatus7%
H04BTransmission7%
G01BMeasuring length, thickness or similar linear dimensions4%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light4%
G06FElectric digital data processing4%
H03BGeneration of oscillations, directly or by frequency-changing, by circuits employing active elements which operate in a non-switching manner4%
B01LChemical or physical laboratory apparatus for general use2%
PatentTitleYear
10,459,021Systems and methods for detecting defects in an antenna array and/or in a device coupled to the antenna array201910,458,851Systems and methods for thermal imaging of RF signals20199,893,819'Determining far field error vector magnitude (EVM) of a device under test over the air (OTA)'20189,735,900'Hybrid multimode network analyzer'20179,362,711'Phase-continuous tunable laser'20168,841,923'Device and method for performing remote frequency response measurements'20147,846,396'Sample holder for surface plasmon resonance measuring instruments'20107,817,278'Surface plasmon resonance sensor apparatus having multiple dielectric layers'20107,801,505'Multipulse/multitone mixing receiver'20107,738,106'Method and system for estimating surface plasmon resonance shift'20107,737,947'Tracking motion using an interference pattern'20107,705,990'Optical sources for SPR applications'20107,684,024'Swept-angle SPR measurement system'20107,586,614'System and method for self-referenced SPR measurements'20097,492,351'Optical navigation based on laser feedback or laser interferometry'20097,474,404'Voltage sensor capable of contactless voltage measurement'20097,317,519'Swept-angle SPR measurement system'20087,230,714'Nonlinear filtering for events in SPR sensing'20077,027,676'Optical phase measurement of target'20067,023,557'Parallel interferometric measurements using an expanded local oscillator signal'20067,009,691'System and method for removing the relative phase uncertainty in device characterizations performed with a polarimeter'20066,977,720'Characterization of active and passive optical properties of an optical device'20056,943,891'Determining optical characteristics of optical devices under test'20056,941,039'Optical fiber gratings with azimuthal refractive index perturbation and devices for tuning, attenuating, switching, and modulating optical signals'20056,914,681'Interferometric optical component analyzer based on orthogonal filters'20056,900,896'Method and system for measuring optical characteristics of a sub-component within a composite optical system'20056,882,428'Optical analyzer and method for reducing relative intensity noise in interferometric optical measurements using a continuously tunable laser'20056,813,028'Calibration methodology and system for optical network analyzer'20046,724,468'Single sweep phase shift method and apparatus for measuring chromatic and polarization dependent dispersion'20046,542,668'Very-high-temperature-stable fiber grating-based sensor'2003Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2003–2005Patents assigned to GEORGIA TECH RES INST (2)· patent assignee history
2003–2010Based in Los Gatos, CA, US· patent location history
2004–2014Patents assigned to AGILENT TECHNOLOGIES INC (20)· patent assignee history
2006–2019Based in San Jose, CA, US· patent location history
2009–2010Patents assigned to AVAGO TECH ECBU IP SG PTE LTD (2)· patent assignee history
2010Patents assigned to SIERRA SENSORS GMBH (1)· patent assignee history
2016–2019Patents assigned to KEYSIGHT TECHNOLOGIES INC (5)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| AGILENT TECHNOLOGIES INC | 20 | 2004–2014 |
| KEYSIGHT TECHNOLOGIES INC | 5 | 2016–2019 |
| AVAGO TECH ECBU IP SG PTE LTD | 2 | 2009–2010 |
| GEORGIA TECH RES INST | 2 | 2003–2005 |
| SIERRA SENSORS GMBH | 1 | 2010 |
Locations
| Location | Patents | Span |
|---|---|---|
| San Jose, California, US | 18 | 2006–2019 |
| Los Gatos, California, US | 12 | 2003–2010 |