Inventor
Jürgen Weese
Inventor
Aachen, DE
Overview
Patents· 19 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G06Tprimary
G06TImage data processing or generation, in general41%
A61BDiagnosis38%
A61FFilters implantable into blood vessels3%
G01NInvestigating or analysing materials by determining their chemical or physical properties3%
G06FElectric digital data processing3%
G16HHealthcare informatics, i.e. information and communication technology [ict] specially adapted for the handling or processing of medical or healthcare data3%
G21KHandling of particles or ionising radiation not otherwise provided for3%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests3%
PatentTitleYear
9,367,904'Spatial-temporal warping of different pre-captured medical images'20169,098,899'Determining the specific orientation of an object'20158,175,358'Apparatus and method for the processing of perfusion images'20128,090,427'Methods for ultrasound visualization of a vessel with location and cycle information'20128,050,469'Automated measurement of objects using deformable models'20118,040,352'Adaptive image interpolation for volume rendering'20117,817,829'Image visualization'20107,742,631'Adaptive sampling along edges for surface rendering'20107,742,639'Data set visualization'20107,558,439'Motion artifact correction of tomographical images'20097,519,155'Device and method for adjusting imaging parameters of an X-ray apparatus'20097,421,122'Simultaneous segmentation of multiple or composed objects by mesh adaptation'20087,340,033'X-ray unit having an automatically adjustable collimator'20086,542,770'Method of determining the position of a medical instrument'20036,471,399'X-ray examination device and method for producing undistorted X-ray images'20026,379,043'X-ray examination apparatus and method for generating distortion-free X-ray images'20026,205,350'Medical diagnostic method for the two-dimensional imaging of structures'20016,144,759'Method of determining the transformation between an object and its three-dimensional representation, and device for carrying out the method'20005,956,435'Automatic analysis of two different images of the same object'1999Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1999–2002Patents assigned to PHILIPS CORP (4)· patent assignee history
1999–2001Based in Hamburg, DE· patent location history
2000–2003Based in Henstedt-Ulzburg, DE· patent location history
2002–2016Patents assigned to KONINKL PHILIPS ELECTRONICS NV (13)· patent assignee history
2008–2016Based in Aachen, DE· patent location history
2012–2016Patents assigned to WEESE JURGEN (3)· patent assignee history
2012–2016Patents assigned to BREDNO JORG (2)· patent assignee history
2012Patents assigned to ECK KAI (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| KONINKL PHILIPS ELECTRONICS NV | 13 | 2002–2016 |
| PHILIPS CORP | 4 | 1999–2002 |
| WEESE JURGENself | 3 | 2012–2016 |
| BREDNO JORG | 2 | 2012–2016 |
| ECK KAI | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Aachen, DE | 13 | 2008–2016 |
| Henstedt-Ulzburg, DE | 4 | 2000–2003 |
| Hamburg, DE | 2 | 1999–2001 |