Inventor
Akella V. S. Satya
Inventor
Wappingers Falls, NY, US
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables50%
G11CStatic stores20%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1020%
H10DInorganic electric semiconductor devices10%
PatentTitleYear
5,959,459'Defect monitor and method for automated contactless inline wafer inspection'19994,450,559'Memory system with selective assignment of spare locations'19844,196,389'Test site for a charged coupled device (CCD) array'19804,144,493'Integrated circuit test structure'19794,100,486'Monitor for semiconductor diffusion operations'19783,983,479'Electrical defect monitor structure'1976Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1976–1999Patents assigned to IBM (6)· patent assignee history
1976–1999Based in Wappingers Falls, NY, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 6 | 1976–1999 |
Locations
| Location | Patents | Span |
|---|---|---|
| Wappingers Falls, New York, US | 6 | 1976–1999 |