Inventor
Yasushi Terui
Inventor
Tsuchiura, JP
Overview
Patents· 33 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps65%
G01NInvestigating or analysing materials by determining their chemical or physical properties25%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light5%
H04NPictorial communication, e.g. television3%
LOC103%
PatentTitleYear
11,049,706Mass spectrometer and nozzle member202110,607,825Mass spectrometer202010,453,663Mass spectrometry device and ion detection method therefor201910,332,736Mass spectrometer with ion frequency selection201910,229,821Mass spectrometry device201910,068,756Mass spectrometer20189,921,195'Liquid chromatography-mass spectrometry device'20189,523,663'Mass spectrometer'20169,418,825'Method and device for mass spectrometry'20168,797,522'Light quantity detection method and device therefor'20148,633,841'Signal processing device, mass spectrometer, and photometer'20148,129,674'Mass spectrometric analyzer'20127,999,222'Time-of-flight mass spectrometer'20117,932,486'Mass spectrometer system'20117,928,365'Method and apparatus for mass spectrometry'20117,890,074'Data acquisition system'20117,755,035'Ion trap time-of-flight mass spectrometer'20107,595,484'Mass spectrometric method, mass spectrometric system, diagnosis system, inspection system, and mass spectrometric program'20097,544,930'Tandem type mass analysis system and method'20097,476,850'Method and its apparatus for mass spectrometry'20097,473,892'Mass spectrometer system'20097,186,973'Ion trap/time-of-flight mass analyzing apparatus and mass analyzing method'20077,126,113'Mass spectrometry system'20067,064,319'Mass spectrometer'2006D0522391'Time of flight mass spectrometer'20066,765,200'Mass spectrometry and mass spetrometer using the same'20046,586,730'Plasma ion source mass spectrometer'20036,541,769'Mass spectrometer'20036,020,958'Atomic absorption spectrophotometer'20005,978,082'Atomic absorptiometer and a metal specimen atomic vapor generation apparatus used in the atomic absorotiometer'19995,822,059'Atomic absorption spectrophotometer and graphite tube type cuvette used for the same'19985,801,827'Analysis device using chemical combustion flame'19985,786,887'Atomic absorption spectrophotometer and atomic absorption spectrochemical analysis'1998Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1998–2004Patents assigned to HITACHI LTD (8)· patent assignee history
1998–2000Based in Hitachinaka, JP· patent location history
2003–2014Based in Tsuchiura, JP· patent location history
2006–2021Patents assigned to HITACHI HIGH TECH CORP (24)· patent assignee history
2006Patents assigned to APPLERA CORP (1)· patent assignee history
2012–2014Patents assigned to TERUI YASUSHI (3)· patent assignee history
2014Patents assigned to NAMBA AKIHIRO (1)· patent assignee history
2016–2021Based in Tokyo, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI HIGH TECH CORP | 24 | 2006–2021 |
| HITACHI LTD | 8 | 1998–2004 |
| TERUI YASUSHIself | 3 | 2012–2014 |
| APPLERA CORP | 1 | 2006 |
| NAMBA AKIHIRO | 1 | 2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tsuchiura, JP | 19 | 2003–2014 |
| Tokyo, JP | 9 | 2016–2021 |
| Hitachinaka, JP | 5 | 1998–2000 |