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Inventor

Takahiro Doi

Inventor
Tokyo, JP

Overview

18→
Patents
2002–2020
Patent span
Physics
Primary field (CPC G)

Patents· 18 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

A61Bprimary
A61BDiagnosis19%
G03BApparatus or arrangements for taking photographs or for projecting or viewing them11%
G03GElectrography11%
H04NPictorial communication, e.g. television11%
B07CPostal sorting7%
G01NInvestigating or analysing materials by determining their chemical or physical properties7%
G02BOptical elements, systems or apparatus7%
G06TImage data processing or generation, in general7%
A01DHarvesting4%
F04CRotary-piston, or oscillating-piston, positive-displacement machines for liquids4%
PatentTitleYear
10,578,557Grain quality level discrimination device20209,900,559'Endoscope system'20188,558,879'Endoscope apparatus and measuring method'20138,531,479'Endoscope apparatus and program'20138,496,575'Measuring endoscope apparatus, program and recording medium'20138,390,879'Image forming apparatus'20138,248,465'Measuring endoscope apparatus and program'20128,200,042'Endoscope apparatus and program'20128,081,330'Data outputting apparatus, and recording medium in which data outputting program is recorded'20117,851,722'Optical cracked-grain selector'20107,599,102'Image forming apparatus and image stabilization processing method for image forming device in said image forming apparatus'20097,556,484'Compressor having a small-width portion and a large-width portion in an inner circumferential sliding surface of a swinging roller'20097,522,828'Interchangeable lens type camera system and intermediate accessory'20097,203,441'Image forming apparatus and method for controlling the pre-rotation of a reflecting member'20076,931,208'Camera with an exposure control function'20056,886,804'Socket for pipe coupling'20056,853,806'Camera with an exposure control function'20056,427,128'Apparatus and method for evaluating quality of granular object'2002

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2002–2020Patents assigned to SATAKE ENG CO LTD (3)· patent assignee history
2002Based in Hiroshima, JP· patent location history
2005–2020Based in Tokyo, JP· patent location history
2005–2018Based in Hachioji, JP· patent location history
2007–2013Patents assigned to KONICA MINOLTA BUSINESS TECH (4)· patent assignee history
2007–2013Based in Toyokawa, JP· patent location history
2009–2018Patents assigned to OLYMPUS CORP (7)· patent assignee history
2009Based in Kusatsu, JP· patent location history
2011–2013Patents assigned to DOI TAKAHIRO (7)· patent assignee history
2011–2013Patents assigned to NAKAZAWA YOSHIKI (2)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
DOI TAKAHIROself72011–2013
OLYMPUS CORP72009–2018
KONICA MINOLTA BUSINESS TECH42007–2013
SATAKE ENG CO LTD32002–2020
NAKAZAWA YOSHIKI22011–2013
Locations
LocationPatentsSpan
Tokyo, JP82005–2020
Hachioji, JP42005–2018
Toyokawa, JP42007–2013
Kusatsu, JP12009
Hiroshima, JP12002