Inventor
Roy Emek
Inventor
Tel Aviv, IL
Overview
Patents· 20 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G06Fprimary
G06FElectric digital data processing60%
G06NComputing arrangements based on specific computational models20%
G01RMeasuring electric variables16%
C21DModifying the physical structure of ferrous metals4%
PatentTitleYear
11,074,231Validating modifications to mapping statements for processing hierarchical data structures202110,956,301Production data in continuous integration flows20218,458,652'Device, system and method of modeling homogeneous information'20138,433,668'Context-based failure reporting for a constraint satisfaction problem'20138,161,440'Highly specialized scenarios in random test generation'20128,140,457'Determining compliance rates for probabilistic requests'20127,788,610'Random stimuli generation of memory maps and memory allocations'20107,627,843'Dynamically interleaving randomly generated test-cases for functional verification'20097,562,061'Context-based failure reporting for a constraint satisfaction problem'20097,434,101'Highly specialized scenarios in random test generation'20087,415,444'Determining compliance rates for probabilistic requests'20087,412,649'Viewing and editing markup language files with complex semantics'20087,409,377'Accelerated solution of constraint satisfaction problems by partitioning of the variable space'20087,395,196'Test-cases for functional verification of system-level interconnect'20087,386,521'Automatic test program generation using extended conditional constraint satisfaction'20087,370,296'Modeling language and method for address translation design mechanisms in test generation'20087,266,534'System and method and product of manufacture for automated test generation via constraint satisfaction with duplicated sub-problems'20077,085,748'Hyper-arc consistency in a contraint satisfaction network'20067,007,207'Scheduling of transactions in system-level test program generation'20066,925,405'Adaptive test program generation'2005Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2005–2013Patents assigned to IBM (17)· patent assignee history
2005–2006Based in Kfar Shmaryahu, IL· patent location history
2007–2012Based in Tel Aviv-Yafo, IL· patent location history
2008–2021Based in Tel Aviv, IL· patent location history
2012–2013Patents assigned to EMEK ROY (4)· patent assignee history
2012–2013Patents assigned to JAEGER ITAI (3)· patent assignee history
2012Patents assigned to COPTY SHADY (1)· patent assignee history
2013Patents assigned to ADIR ALLON (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 17 | 2005–2013 |
| EMEK ROYself | 4 | 2012–2013 |
| JAEGER ITAI | 3 | 2012–2013 |
| ADIR ALLON | 1 | 2013 |
| COPTY SHADY | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tel Aviv, IL | 9 | 2008–2021 |
| Tel Aviv-Yafo, IL | 8 | 2007–2012 |
| Kfar Shmaryahu, IL | 3 | 2005–2006 |