Inventor
Patrick M. Maxton
Inventor
San Jose, CA, US
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties56%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light22%
G01BMeasuring length, thickness or similar linear dimensions11%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1011%
PatentTitleYear
7,253,901'Laser-based cleaning device for film analysis tool'20077,202,951'Laser-based cleaning device for film analysis tool'20077,190,441'Methods and systems for preparing a sample for thin film analysis'20076,804,003'System for analyzing surface characteristics with self-calibrating capability'20046,734,968'System for analyzing surface characteristics with self-calibrating capability'2004Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2004Patents assigned to KLA TENCOR CORP (1)· patent assignee history
2004–2007Based in San Jose, CA, US· patent location history
2007Patents assigned to KLA TENCOR TECH CORP (3)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| KLA TENCOR TECH CORP | 3 | 2007 |
| KLA TENCOR CORP | 1 | 2004 |
Locations
| Location | Patents | Span |
|---|---|---|
| San Jose, California, US | 5 | 2004–2007 |