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Inventor

Jae C. Schwartz

Inventor
San Jose, CA, US

Overview

44→
Patents
1993–2019
Patent span
Electricity
Primary field (CPC H)

Patents· 44 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H01Jprimary
H01JElectric discharge tubes or discharge lamps90%
G01NInvestigating or analysing materials by determining their chemical or physical properties6%
B82YSpecific uses or applications of nanostructures4%
PatentTitleYear
10,347,477Methods and systems for quantitative mass analysis201910,128,099Systems and methods for regulating the ion population in an ion trap for MS20189,875,885Systems and methods for ion isolation20189,847,218High-resolution ion trap mass spectrometer20179,818,595'Systems and methods for ion isolation using a dual waveform'20179,711,340'Photo-dissociation beam alignment method'20179,293,312'Identifying the occurrence and location of charging in the ion path of a mass spectrometer'20169,117,646'Method and apparatus for a combined linear ion trap and quadrupole mass filter'20158,552,365'Ion population control in a mass spectrometer having mass-selective transfer optics'20138,415,617'Two-dimensional radial-ejection ion trap operable as a quadrupole mass filter'20138,384,022'Methods and apparatus for calibrating ion trap mass spectrometers'20138,304,720'Two-dimensional ion trap with ramped axial potentials'20128,278,620'Methods for calibration of usable fragmentation energy in mass spectrometry'20128,258,462'Methods of calibrating and operating an ion trap mass analyzer to optimize mass spectral peak characteristics'20128,198,580'Differential-pressure dual ion trap mass analyzer and methods of use thereof'20128,178,835'Prolonged ion resonance collision induced dissociation in a quadrupole ion trap'20128,168,943'Data-dependent selection of dissociation type in a mass spectrometer'20127,960,690'Automatic gain control (AGC) method for an ion trap and a temporally non-uniform ion beam'20117,947,948'Two-dimensional radial-ejection ion trap operable as a quadrupole mass filter'20117,928,373'Isolating ions in quadrupole ion traps for mass spectrometry'20117,804,065'Methods of calibrating and operating an ion trap mass analyzer to optimize mass spectral peak characteristics'20107,692,142'Differential-pressure dual ion trap mass analyzer and methods of use thereof'20107,582,865'Two-dimensional ion trap with ramped axial potentials'20097,534,998'System and method for implementing balanced RF fields in an ion trap device'20097,528,370'High-Q pulsed fragmentation in ion traps'20097,456,396'Isolating ions in quadrupole ion traps for mass spectrometry'20087,425,699'Mass spectrometry method and apparatus'20087,365,318'System and method for implementing balanced RF fields in an ion trap device'20087,265,344'Mass spectrometry method and apparatus'20077,238,936'Detector with increased dynamic range'20077,180,057'Two-dimensional quadrupole ion trap'20077,109,474'Measuring ion number and detector gain'20067,102,129'High-Q pulsed fragmentation in ion traps'20067,034,294'Two-dimensional quadrupole ion trap operated as a mass spectrometer'20066,995,364'Mass spectrometry method and apparatus'20066,949,743'High-Q pulsed fragmentation in ion traps'20056,911,651'Ion trap'20056,872,938'Mass spectrometry method and apparatus'20056,797,950'Two-dimensional quadrupole ion trap operated as a mass spectrometer'20046,392,225'Method and apparatus for transferring ions from an atmospheric pressure ion source into an ion trap mass spectrometer'20026,124,591'Method of ion fragmentation in a quadrupole ion trap'20005,572,022'Method and apparatus of increasing dynamic range and sensitivity of a mass spectrometer'19965,285,063'Method of detecting ions in an ion trap mass spectrometer'19945,182,451'Method of operating an ion trap mass spectrometer in a high resolution mode'1993

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1993–2000Patents assigned to FINNIGAN CORP (4)· patent assignee history
1993–1994Based in Santa Clara, CA, US· patent location history
1996–2017Based in San Jose, CA, US· patent location history
2002–2019Patents assigned to THERMO FINNIGAN LLC (38)· patent assignee history
2010–2019Based in Gilroy, CA, US· patent location history
2012–2013Patents assigned to SCHWARTZ JAE C (9)· patent assignee history
2012–2013Patents assigned to REMES PHILIP M (4)· patent assignee history
2012Patents assigned to SYKA JOHN E P (2)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
THERMO FINNIGAN LLC382002–2019
SCHWARTZ JAE Cself92012–2013
FINNIGAN CORP41993–2000
REMES PHILIP M42012–2013
SYKA JOHN E P22012
Locations
LocationPatentsSpan
San Jose, California, US261996–2017
Gilroy, California, US162010–2019
Santa Clara, California, US21993–1994