Inventor
Norman H. Fontaine
Inventor
Painted Post, NY, US
Overview
Patents· 17 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties58%
G01MTesting static or dynamic balance of machines or structures12%
G02BOptical elements, systems or apparatus8%
Y10TTechnical subjects covered by former us classification8%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light4%
G01LMeasuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure4%
G06FElectric digital data processing4%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests4%
PatentTitleYear
9,989,458High precision measurement of refractive index profile of cylindrical glass bodies20189,588,056'Method for particle detection on flexible substrates'20178,854,623'Systems and methods for measuring a profile characteristic of a glass sample'20148,852,876'Label free biosensors and cells'20148,338,116'Label free biosensors and cells'20128,243,276'Variable penetration depth biosensor'20128,163,561'Method for depth resolved sensing of biological entities based on surface plasmon resonance sensors'20128,148,092'System and method for performing G protein coupled receptor (GPCR) cell assays using waveguide-grating sensors'20128,076,090'Label free biosensors and cells'20118,021,613'System and method for self-referencing a sensor in a micron-sized deep flow chamber'20117,871,811'Method for eliminating crosstalk between waveguide grating-based biosensors located in a microplate and the resulting microplate'20117,571,151'Data analysis tool for analyzing data stored in multiple text files'20097,292,333'Optical interrogation system and method for 2-D sensor arrays'20077,286,221'Arrayed sensor measurement system and method'20077,285,420'System and method for self-referencing a sensor in a micron-sized deep flow chamber'20077,057,720'Optical interrogation system and method for using same'20066,801,306'Streak camera system for measuring fiber bandwidth and differential mode delay'2004Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2004–2018Patents assigned to CORNING INC (16)· patent assignee history
2004–2018Based in Painted Post, NY, US· patent location history
2011–2012Patents assigned to LAHIRI JOYDEEP (4)· patent assignee history
2011–2012Patents assigned to FANG YE (3)· patent assignee history
2011–2012Patents assigned to FERRIE ANN M (3)· patent assignee history
2011–2012Patents assigned to FONTAINE NORMAN H (3)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| CORNING INC | 16 | 2004–2018 |
| LAHIRI JOYDEEP | 4 | 2011–2012 |
| FANG YE | 3 | 2011–2012 |
| FERRIE ANN M | 3 | 2011–2012 |
| FONTAINE NORMAN Hself | 3 | 2011–2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Painted Post, New York, US | 17 | 2004–2018 |