Inventor
Nobuyuki Kosaka
Inventor
Amagasaki, JP
Overview
Patents· 10 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties15%
G06VImage or video recognition or understanding12%
Y10TTechnical subjects covered by former us classification12%
B25BTools or bench devices not otherwise provided for, for fastening, connecting, disengaging, or holding8%
B60KArrangement or mounting of propulsion units or of transmissions in vehicles8%
C23CCoating metallic material8%
G01BMeasuring length, thickness or similar linear dimensions8%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h108%
B01JChemical or physical processes, e.g. catalysis or colloid chemistry4%
E05YIndexing scheme associated with subclasses e05d and e05f, relating to construction elements, electric control, power supply, power signal or transmission, user interfaces, mounting or coupling, details, accessories, auxiliary operations not otherwise provided for, application thereof4%
PatentTitleYear
8,205,313'Structure for attaching vibration insulating member'20127,647,955'Filler pipe assembly'20105,976,260'Semiconductor producing apparatus, and wafer vacuum chucking device, gas cleaning method and nitride film forming method in semiconductor producing apparatus'19995,534,073'Semiconductor producing apparatus comprising wafer vacuum chucking device'19965,481,095'Code reading pattern and an image pickup apparatus for reading the pattern'19965,379,150'Method of manufacturing a spatial frequency filter for use in a pattern defect detection device'19955,317,618'Light transmission type vacuum separating window and soft X-ray transmitting window'19945,305,366'Thin film forming apparatus'19945,289,260'Pattern defect detection device and a spatial frequency filter used therein'19945,170,063'Inspection device for detecting defects in a periodic pattern on a semiconductor wafer'1992Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1992–1999Patents assigned to MITSUBISHI ELECTRIC CORP (8)· patent assignee history
1992–1999Based in Amagasaki, JP· patent location history
1994–1996Based in Hyogo, JP· patent location history
2010–2012Patents assigned to HONDA MOTOR CO LTD (2)· patent assignee history
2010Based in Wako, JP· patent location history
2012Patents assigned to CHIBA TAKESHI (1)· patent assignee history
2012Patents assigned to KANEYASU YOSHIKAZU (1)· patent assignee history
2012Patents assigned to KOSAKA NOBUYUKI (1)· patent assignee history
2012Based in Saitama, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| MITSUBISHI ELECTRIC CORP | 8 | 1992–1999 |
| HONDA MOTOR CO LTD | 2 | 2010–2012 |
| CHIBA TAKESHI | 1 | 2012 |
| KANEYASU YOSHIKAZU | 1 | 2012 |
| KOSAKA NOBUYUKIself | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Amagasaki, JP | 4 | 1992–1999 |
| Hyogo, JP | 4 | 1994–1996 |
| Saitama, JP | 1 | 2012 |
| Wako, JP | 1 | 2010 |