Inventor
Tatsuya Fukugaki
Inventor
Hitachinaka, JP
Overview
Patents· 21 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties49%
B65GTransport or storage devices, e.g. conveyors for loading or tipping, shop conveyor systems or pneumatic tube conveyors13%
B01LChemical or physical laboratory apparatus for general use10%
LOC245%
B01JChemical or physical processes, e.g. catalysis or colloid chemistry3%
B23PMetal-working not otherwise provided for3%
B25JManipulators3%
B65BMachines, apparatus or devices for, or methods of, packaging articles or materials3%
B65CLabelling or tagging machines, apparatus, or processes3%
B67CCleaning, filling with liquids or semiliquids, or emptying, of bottles, jars, cans, casks, barrels, or similar containers, not otherwise provided for3%
PatentTitleYear
11,067,589Automated analyzer202111,041,872Automatic analysis device202110,816,564Sample test automation system20209,884,725'Specimen transport device, specimen pretreatment system, analysis system, and specimen testing automation system'20189,857,389'Specimen storage apparatus, specimen processing system, and controlling method thereof'20189,753,048'Sample test automation system'20179,696,330'Sample conveyor apparatus and specimen testing automation system'20179,636,681'Holder for transferring test tube'20179,476,806'Sample processing system'20169,470,608'Sample processing system'20169,390,597'Laboratory automation apparatus, automated analytical apparatus and system'20169,291,633'Automated sample processing system'20169,211,543'Holder for transferring test tube'20159,176,156'Automatic analyzer including pressure sensor for washing solution'20159,097,690'Sample preprocessing and conveying system'20158,956,568'Sample transfer mechanism'20158,877,128'Automated sample testing system'20148,833,186'Sample conveying system'20148,760,264'Article conveying system and sample processing system'2014D0637312'Portion of a holder for test tube'2011D0637311'Holder for test tube'2011Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2011–2021Patents assigned to HITACHI HIGH TECH CORP (21)· patent assignee history
2011–2020Based in Hitachinaka, JP· patent location history
2014–2017Patents assigned to FUKUGAKI TATSUYA (10)· patent assignee history
2014–2017Patents assigned to OHGA HIROSHI (6)· patent assignee history
2014–2017Patents assigned to HANAWA MASAAKI (3)· patent assignee history
2014–2016Patents assigned to ISOBE TETSUYA (3)· patent assignee history
2015–2021Based in Tokyo, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI HIGH TECH CORP | 21 | 2011–2021 |
| FUKUGAKI TATSUYAself | 10 | 2014–2017 |
| OHGA HIROSHI | 6 | 2014–2017 |
| HANAWA MASAAKI | 3 | 2014–2017 |
| ISOBE TETSUYA | 3 | 2014–2016 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hitachinaka, JP | 13 | 2011–2020 |
| Tokyo, JP | 8 | 2015–2021 |