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Inventor

Kenichi Narikawa

Inventor
Nirasaki, JP

Overview

4→
Patents
1976–2020
Patent span
Physics
Primary field (CPC G)

Patents· 4 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables43%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1029%
B29CShaping or joining of plastics14%
B29LIndexing scheme associated with subclass b29c, relating to particular articles14%
PatentTitleYear
10,859,601Device inspection circuit, device inspection device, and probe card202010,114,070Substrate inspection apparatus20187,733,113'Semiconductor test device'20103,950,467'Method for shaping tubular films in downward and wet manner'1976

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1976Patents assigned to POLYMER PROCESSING RES INST (1)· patent assignee history
1976Based in Tokyo, JP· patent location history
2010Patents assigned to YOKOGAWA ELECTRIC CORP (1)· patent assignee history
2010Based in Musashino, JP· patent location history
2018–2020Patents assigned to TOKYO ELECTRON LTD (2)· patent assignee history
2018–2020Based in Nirasaki, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
TOKYO ELECTRON LTD22018–2020
POLYMER PROCESSING RES INST11976
YOKOGAWA ELECTRIC CORP12010
Locations
LocationPatentsSpan
Nirasaki, JP22018–2020
Musashino, JP12010
Tokyo, JP11976