Inventor
KENNETH W. DEBOE
Inventor
US
Overview
Patents· 11 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables30%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1030%
H01LSemiconductor devices22%
H05KPrinted circuits11%
G06FElectric digital data processing8%
PatentTitleYear
12,292,484Method and system for thermal control of devices in an electronics tester202512,265,136Method and system for thermal control of devices in electronics tester202512,169,217Electronics tester202412,163,999Apparatus for testing electronic devices202412,007,451Method and system for thermal control of devices in an electronics tester202411,860,221Apparatus for testing electronic devices202411,821,940Electronics tester202311,635,459Electronics tester202311,255,903Apparatus for testing electronic devices202211,209,497Method and system for thermal control of devices in an electronics tester202111,199,572Electronics tester2021Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2021–2025Patents assigned to AEHR TEST SYSTEMS (11)· patent assignee history
2021–2025Based in US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| AEHR TEST SYSTEMS | 11 | 2021–2025 |
Locations
| Location | Patents | Span |
|---|---|---|
| US | 11 | 2021–2025 |