Inventor

Dan Vacar

Inventor

San Diego, CA, US

Overview

17→

Patents

2007–2016

Patent span

Physics

Primary field (CPC G)

Patents· 17 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary

G01RMeasuring electric variables38%

G06FElectric digital data processing33%

G01BMeasuring length, thickness or similar linear dimensions5%

G01MTesting static or dynamic balance of machines or structures5%

G08BSignalling systems, e.g. personal calling systems5%

G11BInformation storage based on relative movement between record carrier and transducer5%

H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light5%

H04QSelecting5%

PatentTitleYear

9,229,045'In-situ characterization of a solid-state light source'2016 8,140,277'Enhanced characterization of electrical connection degradation'2012 7,982,468'Apparatus and method for testing electrical interconnects with switches'2011 7,920,986'Surface shape metric and method to quantify the surface shape of electronic packages'2011 7,890,278'Characterizing the response of a device in a computer system to vibration over a frequency range'2011 7,870,440'Method and apparatus for detecting multiple anomalies in a cluster of components'2011 7,800,385'Apparatus and method for testing electrical interconnects'2010 7,680,624'Method and apparatus for performing a real-time root-cause analysis by analyzing degrading telemetry signals'2010 7,668,696'Method and apparatus for monitoring the health of a computer system'2010 7,577,542'Method and apparatus for dynamically adjusting the resolution of telemetry signals'2009 7,466,404'Technique for diagnosing and screening optical interconnect light sources'2008 7,353,431'Method and apparatus for proactive fault monitoring in interconnects'2008 7,330,325'Proactive fault monitoring of disk drives through phase-sensitive surveillance'2008 7,283,919'Determining the quality and reliability of a component by monitoring dynamic variables'2007 7,216,062'Characterizing degradation of components during reliability-evaluation studies'2007 7,184,932'Reliability prediction for complex components'2007 7,162,393'Detecting degradation of components during reliability-evaluation studies'2007

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2007–2010Patents assigned to SUN MICROSYSTEMS INC (10)· patent assignee history

2007–2016Based in San Diego, CA, US· patent location history

2010–2016Patents assigned to ORACLE AMERICA INC (7)· patent assignee history

2012–2016Patents assigned to GROSS KENNY C (2)· patent assignee history

2012–2016Patents assigned to LOPEZ LEONCIO D (2)· patent assignee history

2012–2016Patents assigned to MCELFRESH DAVID K (2)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
SUN MICROSYSTEMS INC	10	2007–2010
ORACLE AMERICA INC	7	2010–2016
GROSS KENNY C	2	2012–2016
LOPEZ LEONCIO D	2	2012–2016
MCELFRESH DAVID K	2	2012–2016

Locations

Location	Patents	Span
San Diego, California, US	17	2007–2016