Inventor

Mamoru Izumi

Inventor

Tokyo, JP

Overview

20→

Patents

1986–2017

Patent span

Performing operations

Primary field (CPC B)

Patents· 20 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

B06Bprimary

B06BMethods or apparatus for generating or transmitting mechanical vibrations of infrasonic, sonic, or ultrasonic frequency, e.g. for performing mechanical work in general26%

A61BDiagnosis13%

G01NInvestigating or analysing materials by determining their chemical or physical properties8%

H04NPictorial communication, e.g. television8%

A61NElectrotherapy5%

B41JTypewriters5%

G01RMeasuring electric variables5%

H10NElectric solid-state devices not otherwise provided for5%

C30BSingle-crystal growth3%

G02BOptical elements, systems or apparatus3%

PatentTitleYear

9,719,966'Ultrasonic flaw detecting apparatus, ultrasonic transducer, and ultrasonic flaw detecting method'2017 7,288,069'Ultrasonic probe and method of manufacturing the same'2007 6,045,208'Ink-jet recording device having an ultrasonic generating element array'2000 6,020,675'Ultrasonic probe'2000 5,912,679'Ink-jet printer using RF tone burst drive signal'1999 5,743,862'Ultrasonic medical treatment apparatus'1998 5,722,411'Ultrasound medical treatment apparatus with reduction of noise due to treatment ultrasound irradiation at ultrasound imaging device'1998 5,553,618'Method and apparatus for ultrasound medical treatment'1996 5,402,791'Piezoelectric single crystal, ultrasonic probe, and array-type ultrasonic probe'1995 5,327,895'Ultrasonic probe and ultrasonic diagnosing system using ultrasonic probe'1994 5,307,170'Video camera having a vibrating image-processing operation'1994 5,295,487'Ultrasonic probe'1994 5,247,924'Shockwave generator using a piezoelectric element'1993 5,163,436'Ultrasonic probe system'1992 5,115,809'Ultrasonic probe'1992 5,101,278'Automatic focus control apparatus for a video camera'1992 5,021,888'Miniaturized solid state imaging device'1991 4,958,327'Ultrasonic imaging apparatus'1990 4,583,018'Electrode configuration for piezoelectric probe'1986 4,562,736'Method of defect evaluation for ceramic products'1986

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1986Patents assigned to TOKYO SHIBAURA ELECTRIC CO (2)· patent assignee history

1986–2017Based in Tokyo, JP· patent location history

1990–2007Patents assigned to TOSHIBA KK (17)· patent assignee history

2017Patents assigned to IHI CORP (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
TOSHIBA KK	17	1990–2007
TOKYO SHIBAURA ELECTRIC CO	2	1986
IHI CORP	1	2017

Locations

Location	Patents	Span
Tokyo, JP	20	1986–2017