Inventor
ZIJIE HUA
Inventor
CN
Overview
Patents· 8 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties36%
G02BOptical elements, systems or apparatus32%
G01BMeasuring length, thickness or similar linear dimensions23%
G01RMeasuring electric variables9%
PatentTitleYear
12,546,985Dark-field confocal microscopy measurement apparatus and method based on aperture scanning of vortex illumination202612,313,563Dark-field confocal microscopy measurement apparatus based on vortex interference202512,276,615Dark-field confocal microscopy measurement apparatus and method based on multi-fractional angular momentum demodulation202512,216,264Dark-field confocal microscopic measurement apparatus and method based on vortex dichroism202512,203,867Dark-field confocal microscopy measurement apparatus and method based on differential fractional vortex beam202512,204,081Dark-field confocal microscopy measurement apparatus and method based on time-varying fractional-order vortex demodulation202512,196,686Vortex dichroism dark-field confocal microscopy measurement apparatus based on spiral transformation202512,111,453Differential dark-field confocal microscopic measurement apparatus and method based on polarized vector light beam2024Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2024–2026Patents assigned to HARBIN INST TECHNOLOGY (8)· patent assignee history
2024–2026Based in CN· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HARBIN INST TECHNOLOGY | 8 | 2024–2026 |
Locations
| Location | Patents | Span |
|---|---|---|
| CN | 8 | 2024–2026 |