LexDanaLexDanabeta
Inventor

Franz Pfeiffer

Inventor
Brugg, CH

Overview

21→
Patents
2008–2021
Patent span
Physics
Primary field (CPC G)

Patents· 21 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

A61Bprimary
A61BDiagnosis30%
G21KHandling of particles or ionising radiation not otherwise provided for25%
G01NInvestigating or analysing materials by determining their chemical or physical properties16%
G02BOptical elements, systems or apparatus4%
G03BApparatus or arrangements for taking photographs or for projecting or viewing them4%
H01JElectric discharge tubes or discharge lamps4%
H01RElectrically-conductive connections4%
H04NPictorial communication, e.g. television4%
A61KPreparations for medical, dental or toiletry purposes2%
B60RVehicles, vehicle fittings, or vehicle parts, not otherwise provided for2%
PatentTitleYear
11,116,076Flexible conductor track for connecting electronic modules, particularly modules of a camera to be installed in a vehicle202110,697,902X-ray tensor tomography system202010,638,027Low-impedance coaxial connection device with housing for a camera module202010,568,588Tiled detector arrangement for differential phase contrast CT202010,485,492Source-detector arrangement20199,557,280'X-ray tomography device'20179,480,447'Inclined phase grating structures'20169,230,703'Gratings for X-ray imaging, consisting of at least two materials'20168,374,309'Arrangement and method for projective and/or tomographic phase-contrast imaging using X-ray radiation'20138,165,270'X-ray optical grating and method for the production thereof, and X-ray detector embodying same'20128,041,004'X-ray interferometer for phase contrast imaging'20118,009,796'X-ray CT system to generate tomographic phase contrast or dark field exposures'20117,983,381'X-ray CT system for x-ray phase contrast and/or x-ray dark field imaging'20117,889,838'Interferometer for quantitative phase contrast imaging and tomography with an incoherent polychromatic x-ray source'20117,817,777'Focus detector arrangement and method for generating contrast x-ray images'20107,653,177'Measurement system and method for the noninvasive determination of properties of an object to be examined and contrast medium X-ray phase-contrast measurement'20107,639,786'X-ray optical transmission grating of a focus-detector arrangement of an X-ray apparatus for generating projective or tomographic phase contrast recordings of a subject'20097,564,941'Focus-detector arrangement for generating projective or tomographic phase contrast recordings with X-ray optical gratings'20097,492,871'Focus/detector system of an x-ray apparatus for generating phase contrast recordings'20097,486,770'Focus-detector arrangement of an X-ray apparatus for generating projective or tomographic phase contrast recordings'20097,433,444'Focus-detector arrangement of an X-ray apparatus for generating projective or tomographic phase contrast recordings'2008

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2008–2013Patents assigned to SIEMENS AG (11)· patent assignee history
2008–2012Based in Brugg, CH· patent location history
2011–2013Patents assigned to SCHERRER INST PAUL (6)· patent assignee history
2012–2017Patents assigned to PFEIFFER FRANZ (5)· patent assignee history
2012–2013Patents assigned to DAVID CHRISTIAN (2)· patent assignee history
2013–2020Based in Garching, DE· patent location history
2019–2020Based in Unterfohring, DE· patent location history
2020–2021Patents assigned to CONTI TEMIC MICROELECTRONIC GMBH (2)· patent assignee history
2020Based in Ulm-Einsingen, DE· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
SIEMENS AG112008–2013
SCHERRER INST PAUL62011–2013
PFEIFFER FRANZself52012–2017
CONTI TEMIC MICROELECTRONIC GMBH22020–2021
DAVID CHRISTIAN22012–2013
Locations
LocationPatentsSpan
Brugg, CH122008–2012
Garching, DE52013–2020
Unterfohring, DE22019–2020
Ulm-Einsingen, DE12020