Inventor
Michael Friedmann
Inventor
Mountain View, CA, US
Overview
Patents· 37 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties23%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices22%
G01BMeasuring length, thickness or similar linear dimensions10%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h109%
G06FElectric digital data processing8%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h108%
G03BApparatus or arrangements for taking photographs or for projecting or viewing them7%
H01LSemiconductor devices5%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light2%
G02BOptical elements, systems or apparatus2%
PatentTitleYear
11,121,521System and method for pumping laser sustained plasma with interlaced pulsed illumination sources202110,859,518X-ray zoom lens for small angle x-ray scatterometry202010,804,167Methods and systems for co-located metrology202010,663,392Variable aperture mask202010,599,712Shared image database with geographic navigation202010,451,412Apparatus and methods for detecting overlay errors using scatterometry201910,365,211Systems and methods for metrology beam stabilization201910,235,390Shared image database with geographic navigation201910,151,584Periodic patterns and technique to control misalignment between two layers20189,835,447Periodic patterns and technique to control misalignment between two layers20179,552,426'Shared image database with geographic navigation'20179,476,698'Periodic patterns and technique to control misalignment between two layers'20169,234,745'Periodic patterns and techniques to control misalignment between two layers'20169,103,662'Periodic patterns and technique to control misalignment between two layers'20159,104,696'Shared image database with geographic navigation'20158,793,248'Method and system for recommending Geo-tagged items'20148,570,515'Periodic patterns and technique to control misalignment between two layers'20138,525,994'Periodic patterns and technique to control misaligment between two layers'20138,472,981'Shared image database with geographic navigation'20138,107,975'Shared image database with geographic navigation'20127,953,422'Shared image database with geographic navigation'20117,933,016'Apparatus and methods for detecting overlay errors using scatterometry'20117,876,440'Apparatus and methods for detecting overlay errors using scatterometry'20117,797,019'Shared image database with geographic navigation'20107,663,753'Apparatus and methods for detecting overlay errors using scatterometry'20107,656,528'Periodic patterns and technique to control misalignment between two layers'20107,564,557'Apparatus and methods for detecting overlay errors using scatterometry'20097,433,040'Apparatus and methods for detecting overlay errors using scatterometry'20087,385,699'Apparatus and methods for detecting overlay errors using scatterometry'20087,379,183'Apparatus and methods for detecting overlay errors using scatterometry'20087,317,531'Apparatus and methods for detecting overlay errors using scatterometry'20087,301,634'Apparatus and methods for detecting overlay errors using scatterometry'20077,298,481'Apparatus and methods for detecting overlay errors using scatterometry'20077,289,213'Apparatus and methods for detecting overlay errors using scatterometry'20077,280,212'Apparatus and methods for detecting overlay errors using scatterometry'20077,277,172'Measuring overlay and profile asymmetry using symmetric and anti-symmetric scatterometry signals'20077,242,477'Apparatus and methods for detecting overlay errors using scatterometry'2007Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2007–2011Patents assigned to KLA TENCOR TECH CORP (14)· patent assignee history
2007–2021Based in Mountain View, CA, US· patent location history
2010–2020Patents assigned to KLA TENCOR CORP (13)· patent assignee history
2010–2013Patents assigned to RESEARCH IN MOTION LTD (3)· patent assignee history
2010–2019Based in Nesher, IL· patent location history
2010Based in Waterloo, CA· patent location history
2011–2020Based in Kitchener, CA· patent location history
2013–2014Patents assigned to FRIEDMANN MICHAEL (3)· patent assignee history
2014Based in Bonn, DE· patent location history
2015–2020Patents assigned to BLACKBERRY LTD (4)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| KLA TENCOR TECH CORP | 14 | 2007–2011 |
| KLA TENCOR CORP | 13 | 2010–2020 |
| BLACKBERRY LTD | 4 | 2015–2020 |
| FRIEDMANN MICHAELself | 3 | 2013–2014 |
| RESEARCH IN MOTION LTD | 3 | 2010–2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Mountain View, California, US | 19 | 2007–2021 |
| Nesher, IL | 9 | 2010–2019 |
| Kitchener, CA | 7 | 2011–2020 |
| Bonn, DE | 1 | 2014 |
| Waterloo, CA | 1 | 2010 |