Inventor
Marko Tuominen
Inventor
Helsinki, FI
Overview
Patents· 52 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Pprimary
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1021%
C23CCoating metallic material20%
H01LSemiconductor devices15%
H10DInorganic electric semiconductor devices11%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h108%
C30BSingle-crystal growth4%
C23FNon-mechanical removal of metallic material from surface3%
H01JElectric discharge tubes or discharge lamps3%
B05DProcesses for applying fluent materials to surfaces, in general3%
C09KMaterials for miscellaneous applications, not provided for elsewhere2%
PatentTitleYear
11,094,535Selective passivation and selective deposition202111,056,385Selective formation of metallic films on metallic surfaces202111,047,040Dual selective deposition202110,814,349Vapor phase deposition of organic films202010,695,794Vapor phase deposition of organic films202010,662,533Thermal atomic layer etching processes202010,665,425Atomic layer etching processes202010,662,534Thermal atomic layer etching processes202010,456,808Selective deposition of metals, metal oxides, and dielectrics201910,443,123Dual selective deposition201910,343,186Vapor phase deposition of organic films201910,283,319Atomic layer etching processes201910,280,519Thermal atomic layer etching processes201910,273,584Thermal atomic layer etching processes201910,157,786Selective formation of metallic films on metallic surfaces201810,049,924Selective formation of metallic films on metallic surfaces201810,047,435Dual selective deposition20189,895,715'Selective deposition of metals, metal oxides, and dielectrics'20189,679,808'Selective formation of metallic films on metallic surfaces'20179,587,307'Enhanced deposition of noble metals'20179,520,562'Method of making a resistive random access memory'20169,514,956'Method of growing oxide thin films'20169,502,289'Selective formation of metallic films on metallic surfaces'20169,472,757'Method of making a resistive random access memory device'20169,469,899'Selective deposition of noble metal thin films'20169,257,303'Selective formation of metallic films on metallic surfaces'20169,112,003'Selective formation of metallic films on metallic surfaces'20158,956,971'Selective formation of metallic films on metallic surfaces'20158,927,403'Selective deposition of noble metal thin films'20158,592,294'High temperature atomic layer deposition of dielectric oxides'20138,501,275'Enhanced deposition of noble metals'20138,309,173'System for controlling the sublimation of reactants'20128,025,922'Enhanced deposition of noble metals'20117,985,669'Selective deposition of noble metal thin films'20117,851,019'Method for controlling the sublimation of reactants'20107,824,492'Method of growing oxide thin films'20107,771,534'Method of growing oxide thin films'20107,771,533'Atomic-layer-chemical-vapor-deposition of films that contain silicon dioxide'20107,704,896'Atomic layer deposition of thin films on germanium'20107,666,773'Selective deposition of noble metal thin films'20107,601,225'System for controlling the sublimation of reactants'20097,476,618'Selective formation of metal layers in an integrated circuit'20097,045,406'Method of forming an electrode with adjusted work function'20067,038,284'Methods for making a dielectric stack in an integrated circuit'20066,806,145'Low temperature method of forming a gate stack with a high k layer deposited over an interfacial oxide layer'20046,794,314'Method of forming ultrathin oxide layer'20046,759,325'Sealing porous structures'20046,660,660'Methods for making a dielectric stack in an integrated circuit'20036,492,283'Method of forming ultrathin oxide layer'20026,048,398'Device for epitaxially growing objects'20006,039,812'Device for epitaxially growing objects and method for such a growth'20005,879,462'Device for heat treatment of objects and a method for producing a susceptor'1999Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1999–2000Patents assigned to ABB RESEARCH LTD (3)· patent assignee history
1999–2000Based in Linkoping, SE· patent location history
2002–2021Based in Espoo, FI· patent location history
2004–2016Patents assigned to ASM INT (20)· patent assignee history
2004–2021Based in Helsinki, FI· patent location history
2012–2016Patents assigned to TUOMINEN MARKO (5)· patent assignee history
2016–2021Patents assigned to ASM IP HOLDING BV (17)· patent assignee history
2016–2021Patents assigned to ASM INT NV (8)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ASM INT | 20 | 2004–2016 |
| ASM IP HOLDING BV | 17 | 2016–2021 |
| ASM INT NV | 8 | 2016–2021 |
| TUOMINEN MARKOself | 5 | 2012–2016 |
| ABB RESEARCH LTD | 3 | 1999–2000 |
Locations
| Location | Patents | Span |
|---|---|---|
| Helsinki, FI | 34 | 2004–2021 |
| Espoo, FI | 15 | 2002–2021 |
| Linkoping, SE | 3 | 1999–2000 |