Inventor
Chuanyong Huang
Inventor
San Jose, CA, US
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties45%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1027%
G01BMeasuring length, thickness or similar linear dimensions9%
G01DMeasuring not specially adapted for a specific variable9%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light9%
PatentTitleYear
10,739,276Minimizing filed size to reduce unwanted stray light202010,324,045Surface defect inspection with large particle monitoring and laser power control201910,088,345Haze and defect distribution and aperture configuration in surface metrology inspectors20189,970,873System and method for luminescent tag based wafer inspection20189,726,615'System and method for simultaneous dark field and phase contrast inspection'2017Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2017–2020Patents assigned to KLA TENCOR CORP (5)· patent assignee history
2017–2020Based in San Jose, CA, US· patent location history
2018Based in Milpitas, CA, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| KLA TENCOR CORP | 5 | 2017–2020 |
Locations
| Location | Patents | Span |
|---|---|---|
| San Jose, California, US | 4 | 2017–2020 |
| Milpitas, California, US | 1 | 2018 |