Inventor
Akio Sumita
Inventor
Yokohama, JP
Overview
Patents· 7 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Tprimary
G01TMeasurement of nuclear or x-radiation45%
G01BMeasuring length, thickness or similar linear dimensions18%
G01NInvestigating or analysing materials by determining their chemical or physical properties18%
G01CMeasuring distances, levels or bearings9%
G21KHandling of particles or ionising radiation not otherwise provided for9%
PatentTitleYear
9,841,279'Apparatus and method for quantitative evaluation of braze bonding length with use of radiation'20179,625,273'Thickness measurement apparatus and method thereof'20178,044,356'Survey meter'20116,570,160'Radiation detecting apparatus'20036,407,392'Radiation detector'20026,392,236'Radiation detector'20026,333,502'Radiation detector, radiation measurement system and radiation measurement method'2001Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2001–2017Patents assigned to TOSHIBA KK (7)· patent assignee history
2001–2017Based in Yokohama, JP· patent location history
2002Based in Kanagawa, JP· patent location history
2017Patents assigned to KURODA HIDEHIKO (1)· patent assignee history
2017Patents assigned to SUMITA AKIO (1)· patent assignee history
2017Patents assigned to YAMASHITA YOSHIHIRO (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TOSHIBA KK | 7 | 2001–2017 |
| KURODA HIDEHIKO | 1 | 2017 |
| SUMITA AKIOself | 1 | 2017 |
| YAMASHITA YOSHIHIRO | 1 | 2017 |
Locations
| Location | Patents | Span |
|---|---|---|
| Yokohama, JP | 5 | 2001–2017 |
| Kanagawa, JP | 2 | 2002 |