Inventor
Guy Eytan
Inventor
Kidron, IL
Overview
Patents· 8 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps38%
G01NInvestigating or analysing materials by determining their chemical or physical properties19%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1019%
B08BCleaning in general6%
G01RMeasuring electric variables6%
H01LSemiconductor devices6%
H05FStatic electricity6%
PatentTitleYear
11,049,704Cleanliness monitor and a method for monitoring a cleanliness of a vacuum chamber202110,910,204Cleanliness monitor and a method for monitoring a cleanliness of a vacuum chamber202110,886,092Charged particle beam source and a method for assembling a charged particle beam source202110,716,197System, computer program product, and method for dissipation of an electrical charge202010,249,472Charged particle beam device, charged particle beam influencing device, and method of operating a charged particle beam device201910,217,621Cleanliness monitor and a method for monitoring a cleanliness of a vacuum chamber20198,804,299'Electrostatic chuck and a method for supporting a wafer'20147,235,794'System and method for inspecting charged particle responsive resist'2007Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2007Patents assigned to APPLIED MATERIALS INC (1)· patent assignee history
2007Based in Menora, IL· patent location history
2014–2021Patents assigned to APPLIED MATERIALS ISRAEL LTD (6)· patent assignee history
2014Patents assigned to CHIRKO KONSTANTIN (1)· patent assignee history
2014Patents assigned to EYTAN GUY (1)· patent assignee history
2014–2021Based in Kidron, IL· patent location history
2019Patents assigned to ICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| APPLIED MATERIALS ISRAEL LTD | 6 | 2014–2021 |
| APPLIED MATERIALS INC | 1 | 2007 |
| CHIRKO KONSTANTIN | 1 | 2014 |
| EYTAN GUYself | 1 | 2014 |
| ICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH | 1 | 2019 |
Locations
| Location | Patents | Span |
|---|---|---|
| Kidron, IL | 7 | 2014–2021 |
| Menora, IL | 1 | 2007 |