Inventor
Fan-Tien Cheng
Inventor
Tainan, TW
Overview
Patents· 23 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G05Bprimary
G05BControl or regulating systems in general25%
Y02PClimate change mitigation technologies in the production or processing of goods20%
G06FElectric digital data processing14%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h107%
G06NComputing arrangements based on specific computational models6%
G01NInvestigating or analysing materials by determining their chemical or physical properties4%
G06QInformation and communication technology [ict] specially adapted for administrative, commercial, financial, managerial or supervisory purposes4%
H04LTransmission of digital information, e.g. telegraphic communication4%
B23QDetails, components, or accessories for machine tools, e.g. arrangements for copying or controlling3%
G06TImage data processing or generation, in general3%
PatentTitleYear
10,948,903System and method that consider tool interaction effects for identifying root causes of yield loss202110,935,962System and method for identifying root causes of yield loss202110,695,884Tool wear monitoring and predicting method202010,618,137Automated constructing method of cloud manufacturing service and cloud manufacturing system202010,345,794Product quality prediction method for mass customization201910,269,660Metrology sampling method with sampling rate decision scheme and computer program product thereof201910,242,319Baseline predictive maintenance method for target device and computer program product thereof20199,829,415Metrology sampling method and computer program product thereof20179,508,042'Method for predicting machining quality of machine tool'20168,983,644'Manufacturing execution system with virtual-metrology capabilities and manufacturing system including the same'20158,862,525'Method for screening samples for building prediction model and computer program product thereof'20148,688,256'Advanced process control system and method utilizing virtual metrology with reliance index'20148,515,793'Virtual production control system and method and computer program product thereof'20138,095,484'System and method for automatic virtual metrology'20127,603,328'Dual-phase virtual metrology method'20097,593,912'Method for evaluating reliance level of a virtual metrology system in product manufacturing'20097,493,185'Quality prognostics system and method for manufacturing processes'20097,457,236'Method for providing fault-tolerant application cluster service'20087,386,751'Generic service management system'20087,359,759'Method and system for virtual metrology in semiconductor manufacturing'20087,162,394'Generic embedded device and mechanism thereof for various intelligent-maintenance applications'20077,034,713'Autonomous and universal remote control scheme'20067,003,367'Equipment management method'2006Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2006–2015Patents assigned to CHENG FAN-TIEN (5)· patent assignee history
2006–2021Based in Tainan, TW· patent location history
2007–2021Patents assigned to UNIV NAT CHENG KUNG (20)· patent assignee history
2012–2015Patents assigned to HUANG HSIEN-CHENG (2)· patent assignee history
2014–2015Patents assigned to KAO CHI-AN (2)· patent assignee history
2015Patents assigned to CHANG YUNG-CHENG (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| UNIV NAT CHENG KUNG | 20 | 2007–2021 |
| CHENG FAN-TIENself | 5 | 2006–2015 |
| HUANG HSIEN-CHENG | 2 | 2012–2015 |
| KAO CHI-AN | 2 | 2014–2015 |
| CHANG YUNG-CHENG | 1 | 2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tainan, TW | 23 | 2006–2021 |