Inventor
Janos Boda
Inventor
Budapest, HU
Overview
Patents· 4 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables50%
G01NInvestigating or analysing materials by determining their chemical or physical properties33%
G01BMeasuring length, thickness or similar linear dimensions17%
PatentTitleYear
5,406,214'Method and apparatus for measuring minority carrier lifetime in semiconductor materials'19954,995,939'Method and apparatus for determining the layer thickness of semiconductor layer structures'19914,571,541'Method for determining charged energy states of semiconductor or insulator materials by using deep level transient spectroscopy, and an apparatus for carrying out the method'19864,437,060'Method for deep level transient spectroscopy scanning and apparatus for carrying out the method'1984Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1984–1991Patents assigned to MAGYAR TUDOMANYOS AKADEMIA (3)· patent assignee history
1984–1995Based in Budapest, HU· patent location history
1995Patents assigned to SEMILAB FELVEZETO FIZ LAB RT (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| MAGYAR TUDOMANYOS AKADEMIA | 3 | 1984–1991 |
| SEMILAB FELVEZETO FIZ LAB RT | 1 | 1995 |
Locations
| Location | Patents | Span |
|---|---|---|
| Budapest, HU | 4 | 1984–1995 |