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Inventor

Longmin Chen

Inventor
Beijing, CN

Overview

3→
Patents
2017–2018
Patent span
Physics
Primary field (CPC G)

Patents· 3 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions38%
G01DMeasuring not specially adapted for a specific variable38%
G01MTesting static or dynamic balance of machines or structures13%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices13%
PatentTitleYear
9,885,556'Dual-frequency grating interferometer displacement measurement system'20189,879,979'Heterodyne grating interferometer displacement measurement system'20189,766,054'Planar motor rotor displacement measuring device and its measuring method'2017

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2017–2018Patents assigned to UNIV TSINGHUA (3)· patent assignee history
2017Patents assigned to SHANGHAI MICROELECTRONICS EQUI (1)· patent assignee history
2017–2018Based in Beijing, CN· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
UNIV TSINGHUA32017–2018
SHANGHAI MICROELECTRONICS EQUI12017
Locations
LocationPatentsSpan
Beijing, CN32017–2018