Inventor

Naoki Ayata

Inventor

Machida, JP

Overview

46→

Patents

1978–2001

Patent span

Physics

Primary field (CPC G)

Patents· 46 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H04Nprimary

H04NPictorial communication, e.g. television34%

G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices29%

B41JTypewriters11%

H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation5%

G03BApparatus or arrangements for taking photographs or for projecting or viewing them3%

G03GElectrography3%

B23QDetails, components, or accessories for machine tools, e.g. arrangements for copying or controlling2%

G01BMeasuring length, thickness or similar linear dimensions2%

G01DMeasuring not specially adapted for a specific variable2%

G02BOptical elements, systems or apparatus2%

PatentTitleYear

6,264,297'Liquid jet recording using a multi-part drive signal sequentially applied to plural blocks of thermal elements'2001 6,139,126'Information recording apparatus that records by driving plural groups or arrays of recording elements'2000 5,486,848'Recording apparatus which twice ejects droplets to the same position and image forming apparatus with u-shaped material path'1996 5,392,361'Method and apparatus for detecting position of a mark'1995 5,365,342'Alignment and exposure apparatus and method for manufacture of integrated circuits'1994 5,197,118'Control system for a fine pattern printing apparatus'1993 5,050,111'Alignment and exposure apparatus and method for manufacture of integrated circuits'1991 5,006,864'Information read-out and recording apparatus'1991 4,985,778'Copying apparatus capable of designating image areas'1991 4,962,423'Mark detecting method and apparatus'1990 4,937,618'Alignment and exposure apparatus and method for manufacture of integrated circuits'1990 4,933,715'Method of detecting position of a mark'1990 4,918,320'Alignment method usable in a step-and-repeat type exposure apparatus for either global or dye-by-dye alignment'1990 4,866,532'Printing apparatus for system'1989 4,794,648'Mask aligner with a wafer position detecting device'1988 4,737,804'Copying apparatus'1988 4,719,357'Semiconductor circuit manufacturing apparatus having selectively operable detectors for effecting automatic alignment'1988 4,718,040'Printing apparatus or system for recording a color image'1988 4,713,784'Alignment apparatus'1987 4,707,713'Image recording apparatus'1987 4,694,502'Color image reading apparatus'1987 4,688,088'Position detecting device and method'1987 4,669,867'Alignment and exposure apparatus'1987 4,663,534'Position detecting device utilizing selective outputs of the photodetector for accurate alignment'1987 4,655,599'Mask aligner having a photo-mask setting device'1987 4,641,257'Measurement method and apparatus for alignment'1987 4,641,071'System for controlling drive of a wafer stage'1987 4,634,876'Object position detecting apparatus using accumulation type sensor'1987 4,553,834'Mask aligner having a malfunction disposal device'1985 4,538,182'Image processing apparatus'1985 4,527,885'Image recording system having multiple image recording means'1985 4,521,805'Printing apparatus or system'1985 4,520,373'Droplet generating method and apparatus therefor'1985 4,500,918'Original reading apparatus'1985 4,476,486'Image recording system utilizing a plurality of recording units'1984 4,467,348'Image recording device'1984 4,463,361'Ink jet recording apparatus with vacuum platen'1984 4,463,359'Droplet generating method and apparatus thereof'1984 4,461,956'Solid-state photoelectric converter'1984 4,405,857'Solid-state photoelectric converter'1983 4,390,791'Solid-state photoelectric transducer'1983 4,325,086'Recording device'1982 4,323,919'Optical scanner for reading data recorded in plural colors'1982 4,268,841'Image recording method and apparatus therefor'1981 4,139,278'Liquid crystal display device'1979 4,105,335'Interferometric optical phase discrimination apparatus'1978

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1978–2001Patents assigned to CANON KK (46)· patent assignee history

1978–2001Based in Yokohama, JP· patent location history

1983–1995Based in Machida, JP· patent location history

1991Based in Tokyo, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
CANON KK	46	1978–2001

Locations

Location	Patents	Span
Machida, JP	31	1983–1995
Yokohama, JP	14	1978–2001
Tokyo, JP	1	1991