Inventor
Luc De Schepper
Inventor
Hasselt, BE
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables60%
G01NInvestigating or analysing materials by determining their chemical or physical properties40%
PatentTitleYear
5,927,853'Method for thermal impedance evaluation of packaged semiconductor components'19995,915,838'Method and apparatus for local temperature sensing for use in performing high resolution in-situ parameter measurements'19995,833,365'Method for local temperature sensing for use in performing high resolution in-situ parameter measurements'19985,795,063'Method and apparatus for thermal impedance evaluation of packaged semiconductor components'19985,646,540'Apparatus and method for measuring electromagnetic ageing parameter of a circuit element and predicting its values'1997Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1997–1998Patents assigned to IMEC INTER UNI MICRO ELECTR (3)· patent assignee history
1997–1998Patents assigned to LIMBURGS UNI CT (2)· patent assignee history
1997–1999Based in Hasselt, BE· patent location history
1999Patents assigned to IMEC VZW (1)· patent assignee history
1999Patents assigned to LIMBURGS UNIVERSITAIRE CAMPUS (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IMEC INTER UNI MICRO ELECTR | 3 | 1997–1998 |
| LIMBURGS UNI CT | 2 | 1997–1998 |
| IMEC VZW | 1 | 1999 |
| LIMBURGS UNIVERSITAIRE CAMPUS | 1 | 1999 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hasselt, BE | 5 | 1997–1999 |