Inventor
Robert J. Polastre
Inventor
Cold Spring, NY, US
Overview
Patents· 16 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H05Kprimary
H05KPrinted circuits18%
G01RMeasuring electric variables10%
H01LSemiconductor devices10%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1010%
B23KSoldering or unsoldering8%
B32BLayered products, i.e. products built-up of strata of flat or non-flat, e.g. cellular or honeycomb, form8%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein8%
G09GArrangements or circuits for control of indicating devices using static means to present variable information8%
G01BMeasuring length, thickness or similar linear dimensions5%
G02BOptical elements, systems or apparatus5%
PatentTitleYear
10,687,425Method of forming a plurality of electro-optical module assemblies202010,670,656Integrated electro-optical module assembly202010,638,613Method of forming a plurality of electro-optical module assemblies202010,581,037Low-profile battery construct with engineered interfaces202010,393,798Integrated electro-optical module assembly201910,166,632In-situ laser beam position and spot size sensor and high speed scanner calibration, wafer debonding method201910,118,250In-situ laser beam position and spot size sensor and high speed scanner calibration, wafer debonding method201810,108,068Liquid crystal lens with variable focal length201810,101,631Liquid crystal lens with variable focal length20189,820,395'Low cost hermetic micro-electronics'20179,721,864'Low cost hermetic micro-electronics'20179,321,245'Injection of a filler material with homogeneous distribution of anisotropic filler particles through implosion'20168,342,385'Process for mapping formic acid distribution'20136,940,300'Integrated circuits for testing an active matrix display array'20056,437,596'Integrated circuits for testing a display array'20025,546,013'Array tester for determining contact quality and line integrity in a TFT/LCD'1996Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1996–2020Patents assigned to IBM (15)· patent assignee history
1996Based in Ossining, NY, US· patent location history
2002–2020Based in Cold Spring, NY, US· patent location history
2013Patents assigned to DANG BING (1)· patent assignee history
2013Patents assigned to HORTON RAYMOND R (1)· patent assignee history
2013Patents assigned to POLASTRE ROBERT J (1)· patent assignee history
2013Based in Armonk, NY, US· patent location history
2016Patents assigned to GLOBALFOUNDRIES INC (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 15 | 1996–2020 |
| DANG BING | 1 | 2013 |
| GLOBALFOUNDRIES INC | 1 | 2016 |
| HORTON RAYMOND R | 1 | 2013 |
| POLASTRE ROBERT Jself | 1 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Cold Spring, New York, US | 14 | 2002–2020 |
| Armonk, New York, US | 1 | 2013 |
| Ossining, New York, US | 1 | 1996 |