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Inventor

Hironori Sakurai

Inventor
Tokyo, JP

Overview

4→
Patents
2016–2020
Patent span
Physics
Primary field (CPC G)

Patents· 4 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties21%
G05BControl or regulating systems in general14%
H01LSemiconductor devices14%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1014%
Y02PClimate change mitigation technologies in the production or processing of goods14%
A61BDiagnosis7%
G06TImage data processing or generation, in general7%
H04NPictorial communication, e.g. television7%
PatentTitleYear
10,861,145Defect inspection device and defect inspection method202010,816,484Flaw inspection device and flaw inspection method202010,466,181Flaw inspection device and flaw inspection method20199,408,528'Stereoscopic endoscope system'2016

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2016Patents assigned to OLYMPUS CORP (1)· patent assignee history
2016Based in Hino, JP· patent location history
2019–2020Patents assigned to HITACHI HIGH TECH CORP (3)· patent assignee history
2019–2020Based in Tokyo, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
HITACHI HIGH TECH CORP32019–2020
OLYMPUS CORP12016
Locations
LocationPatentsSpan
Tokyo, JP32019–2020
Hino, JP12016