Inventor
Tomoaki Nanko
Inventor
Tokyo, JP
Overview
Patents· 4 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Jprimary
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light50%
G01BMeasuring length, thickness or similar linear dimensions17%
G01NInvestigating or analysing materials by determining their chemical or physical properties17%
G02BOptical elements, systems or apparatus17%
PatentTitleYear
7,323,687'infrared gas analyzer and infrared gas analysis method'20086,322,037'Moving mirror support device for photo-interferometer'20015,715,055'Spectroscope utilizing a coupler to concurrently apply parallel light beams to a sample and a reference light and processing the resulting light beams thereby compensating for environmental changes'19985,592,292'Interference spectrometer with a moving mirror'1997Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1997–2008Patents assigned to YOKOGAWA ELECTRIC CORP (4)· patent assignee history
1997–2001Based in Tokyo, JP· patent location history
2008Based in Musashino, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| YOKOGAWA ELECTRIC CORP | 4 | 1997–2008 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 3 | 1997–2001 |
| Musashino, JP | 1 | 2008 |