Inventor

Yukito Kawahara

Inventor

Chiba, JP

Overview

37→

Patents

1987–2010

Patent span

Electricity

Primary field (CPC H)

Patents· 37 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H04Nprimary

H04NPictorial communication, e.g. television47%

H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation25%

G06VImage or video recognition or understanding6%

B28DWorking stone or stone-like materials4%

G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein4%

G09GArrangements or circuits for control of indicating devices using static means to present variable information4%

H10DInorganic electric semiconductor devices4%

H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h104%

G11CStatic stores2%

PatentTitleYear

7,721,169'Scan circuit and image sensor having scan circuit'2010 7,394,054'Photoelectric converter and a method of driving the same'2008 7,102,115'Photoelectric converter and a method of driving the same'2006 7,015,449'Linear image sensor'2006 6,941,002'Fingerprint reading device and method thereof'2005 6,803,957'Image sensor'2004 6,643,038'Contact type color image sensor'2003 6,618,086'Linear image sensor'2003 6,545,776'Image sensor IC, facsimile apparatus and image scanner apparatus using the image sensor ICS'2003 6,512,604'Color image reading device'2003 6,468,825'Method for producing semiconductor temperature sensor'2002 6,462,563'Fingerprint reading device and method thereof'2002 6,429,413'Image sensor having unit light receiving circuit with sample-and-hold means'2002 6,401,551'Fingerprint reading device'2002 6,327,057'Contact type linear image sensor'2001 6,303,919'Linear image sensor'2001 6,291,810'Image sensor'2001 6,285,047'Linear image sensor device, IC assembling substrate and method for assembling the same'2001 6,046,492'Semiconductor temperature sensor and the method of producing the same'2000 5,665,960'Photoelectric converter device and method of manufacturing the same'1997 5,619,345'Linear image sensor of the contact type'1997 5,426,060'Method of inspecting image sensors'1995 5,329,149'Image sensor with non-light-transmissive layer having photosensing windows'1994 5,321,303'Semiconductor device having linearly arranged semiconductor chips'1994 5,198,654'Image reading apparatus for converting optical image information into an electrical image signal'1993 5,151,587'Image sensor having an array of operative and dummy bipolar transistors and pairs of pixel selecting switches connected thereto'1992 5,146,074'Solid state imaging device'1992 5,119,156'Photo-detecting semiconductor device with passivation suppressing multi-reflections'1992 5,109,440'Image sensing apparatus'1992 5,109,155'Semiconductor image sensor with an integrated voltage regulator'1992 5,060,084'Single substrate semiconductor device for image sensing and printing'1991 4,992,653'Linear image sensor'1991 4,928,095'Active matrix-addressed picture display device'1990 4,906,856'Semiconductive photodetection device having coplanar circuit components'1990 4,901,153'Image sensor with reduced surface reflection interference'1990 4,839,300'Method of manufacturing semiconductor device having trapezoidal shaped substrate sections'1989 4,680,580'Active matrix-addressed liquid-crystal display device'1987

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1987–1989Patents assigned to SEIKO INSTR & ELECTRONICS (2)· patent assignee history

1987–1997Based in Tokyo, JP· patent location history

1990–2008Patents assigned to SEIKO INSTR INC (34)· patent assignee history

1997–2010Based in Chiba, JP· patent location history

2010Patents assigned to SEIKO INSTR INCO (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
SEIKO INSTR INC	34	1990–2008
SEIKO INSTR & ELECTRONICS	2	1987–1989
SEIKO INSTR INCO	1	2010

Locations

Location	Patents	Span
Chiba, JP	20	1997–2010
Tokyo, JP	17	1987–1997