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Inventor

Hyung-Suk Cho

Inventor
Daejeon, KR

Overview

15→
Patents
2002–2020
Patent span
Electricity
Primary field (CPC H)

Patents· 15 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H10Pprimary
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1020%
G01NInvestigating or analysing materials by determining their chemical or physical properties15%
H01MProcesses or means, e.g. batteries, for the direct conversion of chemical energy into electrical energy13%
Y02EReduction of greenhouse gas [ghg] emissions, related to energy generation, transmission or distribution13%
Y02PClimate change mitigation technologies in the production or processing of goods8%
H01JElectric discharge tubes or discharge lamps5%
B01FMixing, e.g. dissolving, emulsifying or dispersing3%
B82BNanostructures formed by manipulation of individual atoms, molecules, or limited collections of atoms or molecules as discrete units3%
B82YSpecific uses or applications of nanostructures3%
C08CTreatment or chemical modification of rubbers3%
PatentTitleYear
10,651,497Apparatus and method for preparing slurry for secondary battery202010,644,316Anode slurry for secondary battery for improving dispersibility and reducing resistance, and anode comprising same202010,535,862System for manufacturing electrode for secondary battery having scratch tester202010,516,160Electrode for lithium secondary battery and lithium secondary battery including the same201910,516,154Positive electrode for lithium secondary battery and method for preparing the same20199,831,137Defect imaging apparatus, defect detection system having the same, and method of detecting defects using the same20179,727,799'Method of automatic defect classification'20179,194,816'Method of detecting a defect of a substrate and apparatus for performing the same'20158,546,154'Apparatus and method to inspect defect of semiconductor device'20138,324,571'Apparatus and method for measuring semiconductor device'20128,034,640'Apparatus and method to inspect defect of semiconductor device'20116,528,333'Method of and device for detecting micro-scratches'20036,462,141'Diene copolymer substituted by alkoxy silane, and organic and inorganic hybrid composition comprising the same'20026,449,037'Method of and device for detecting micro-scratches'20026,440,760'Method of measuring etched state of semiconductor wafer using optical impedence measurement'2002

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2002–2017Patents assigned to SAMSUNG ELECTRONICS CO LTD (9)· patent assignee history
2002–2020Based in Daejeon, KR· patent location history
2002–2003Based in Suwon-si, KR· patent location history
2002Based in Kyungki-do, KR· patent location history
2011–2017Based in Hwaseong-si, KR· patent location history
2012–2013Patents assigned to CHO HYUNG-SUK (2)· patent assignee history
2012–2013Patents assigned to KIM YOUNG-NAM (2)· patent assignee history
2012Patents assigned to KANG SUN-JIN (1)· patent assignee history
2019–2020Patents assigned to LG CHEMICAL LTD (5)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
SAMSUNG ELECTRONICS CO LTD92002–2017
LG CHEMICAL LTD52019–2020
CHO HYUNG-SUKself22012–2013
KIM YOUNG-NAM22012–2013
KANG SUN-JIN12012
Locations
LocationPatentsSpan
Daejeon, KR62002–2020
Hwaseong-si, KR62011–2017
Suwon-si, KR22002–2003
Kyungki-do, KR12002