Inventor
Diana Nyyssonen
Inventor
Hopewell Junction, NY, US
Overview
Patents· 4 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions25%
G01QScanning-probe techniques or apparatus25%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices25%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1013%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests13%
PatentTitleYear
6,128,089'Combined segmented and nonsegmented bar-in-bar targets'20005,969,273'Method and apparatus for critical dimension and tool resolution determination using edge width'19995,633,714'Preprocessing of image amplitude and phase data for CD and OL measurement'19975,186,041'Microprobe-based CD measurement tool'1993Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1993–2000Patents assigned to IBM (4)· patent assignee history
1993–2000Based in Hopewell Junction, NY, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 4 | 1993–2000 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hopewell Junction, New York, US | 4 | 1993–2000 |