Inventor
Xiquan Cui
Inventor
Pasadena, CA, US
Overview
Patents· 17 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G02Bprimary
G02BOptical elements, systems or apparatus35%
G01NInvestigating or analysing materials by determining their chemical or physical properties21%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light12%
G06FElectric digital data processing12%
B82YSpecific uses or applications of nanostructures6%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation6%
A61BDiagnosis3%
G01BMeasuring length, thickness or similar linear dimensions3%
G09GArrangements or circuits for control of indicating devices using static means to present variable information3%
PatentTitleYear
9,454,265'Integration of a light collection light-guide with a field sequential color display'20169,298,284'System and method for optically-based active stylus input recognition'20169,109,949'Near-field optical sensing system'20159,046,680'Scanning illumination microscope'20159,041,690'Channel waveguide system for sensing touch and/or gesture'20159,041,938'Surface wave assisted structures and systems'20159,010,935'Systems and methods for noninvasive analysis of retinal health and function'20158,660,312'Quantitative differential interference contrast (DIC) devices for computed depth sectioning'20148,525,091'Wavefront imaging devices comprising a film with one or more structured two dimensional apertures and their applications in microscopy and photography'20138,416,400'Wavefront imaging sensor'20138,411,282'On-chip phase microscope/beam profiler based on differential interference contrast and/or surface plasmon assisted interference'20138,325,349'Focal plane adjustment by back propagation in optofluidic microscope devices'20128,314,933'Optofluidic microscope device with photosensor array'20128,189,204'Surface wave enabled darkfield aperture'20128,039,776'Quantitative differential interference contrast (DIC) microscopy and photography based on wavefront sensors'20117,982,883'On-chip phase microscope/beam profiler based on differential interference contrast and/or surface plasmon assisted interference'20117,768,654'On-chip phase microscope/beam profiler based on differential interference contrast and/or surface plasmon assisted interference'2010Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2010–2015Patents assigned to CALIFORNIA INST OF TECHN (13)· patent assignee history
2010–2015Based in Pasadena, CA, US· patent location history
2012–2015Patents assigned to CUI XIQUAN (10)· patent assignee history
2012–2015Patents assigned to YANG CHANGHUEI (9)· patent assignee history
2012–2015Patents assigned to HENG XIN (4)· patent assignee history
2012–2015Patents assigned to SCHERER AXEL (3)· patent assignee history
2015–2016Based in San Jose, CA, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| CALIFORNIA INST OF TECHN | 13 | 2010–2015 |
| CUI XIQUANself | 10 | 2012–2015 |
| YANG CHANGHUEI | 9 | 2012–2015 |
| HENG XIN | 4 | 2012–2015 |
| SCHERER AXEL | 3 | 2012–2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Pasadena, California, US | 12 | 2010–2015 |
| San Jose, California, US | 5 | 2015–2016 |