Inventor
TADASHI NISHIYAMA
Inventor
JP
Overview
Patents· 14 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Pprimary
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1017%
G06TImage data processing or generation, in general14%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices13%
G01NInvestigating or analysing materials by determining their chemical or physical properties11%
H01LSemiconductor devices11%
B05DProcesses for applying fluent materials to surfaces, in general6%
H04NPictorial communication, e.g. television5%
Y02PClimate change mitigation technologies in the production or processing of goods5%
G05BControl or regulating systems in general3%
G06QInformation and communication technology [ict] specially adapted for administrative, commercial, financial, managerial or supervisory purposes3%
PatentTitleYear
12,557,608Processing apparatus for forming a coating film on a substrate having a camera and a mirror member202612,501,004Substrate imaging apparatus202512,413,832Substrate inspection apparatus, substrate inspection method, and recording medium202512,314,023Treatment condition setting method, storage medium, and substrate treatment system202512,243,213Substrate inspection device, substrate inspection system, and substrate inspection method202511,832,026Substrate imaging apparatus202311,823,922Substrate inspection apparatus, substrate processing apparatus, substrate inspection method, and computer-readable recording medium202311,791,162Processing apparatus for forming a coating film on a substrate having a camera and a mirror member202311,726,438Treatment condition setting method, storage medium, and substrate treatment system202311,669,955Substrate defect inspection method, storage medium, and substrate defect inspection apparatus202311,609,502Substrate inspection apparatus, substrate processing apparatus, substrate inspection method, and computer-readable recording medium202311,469,435Dummy electrode assembly, fuel cell stack, and method of producing dummy electrode assembly202211,378,388Substrate inspection method, substrate inspection apparatus and recording medium202211,276,872Fuel cell stack2022Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2022–2026Patents assigned to TOKYO ELECTRON LTD (12)· patent assignee history
2022Patents assigned to HONDA MOTOR CO LTD (2)· patent assignee history
2022–2026Based in JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TOKYO ELECTRON LTD | 12 | 2022–2026 |
| HONDA MOTOR CO LTD | 2 | 2022 |
Locations
| Location | Patents | Span |
|---|---|---|
| JP | 14 | 2022–2026 |