Inventor
Karl Wisspeintner
Inventor
Ortenburg, DE
Overview
Patents· 12 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions31%
G01DMeasuring not specially adapted for a specific variable25%
A61BDiagnosis6%
B41JTypewriters6%
D01HSpinning or twisting6%
G01NInvestigating or analysing materials by determining their chemical or physical properties6%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices6%
H03MCoding6%
H05BElectric heating6%
PatentTitleYear
10,060,762Inductive sensor comprising integrated soft magnetic layer and method for the production thereof20188,554,503'Method for calibrating a thickness gauge'20137,369,225'Device and method for inspecting surfaces in the interior of holes'20087,358,982'Imaging device for a printing press'20087,092,833'Method and circuit for linearizing nonlinear curves'20066,999,892'Circuit arrangement and method for controlling and evaluating signal detectors'20066,462,536'Eddy current sensor'20026,318,153'Non-contact film thickness gauging sensor'20016,288,536'Eddy current sensor'20015,606,509'Correction of a measuring signal obtained from a pair of scanning rollers and pertaining to the thickness of a textile fiber sliver'19975,601,743'Apparatus for determining the solid contents of a slug by induction heating'19975,485,082'Method of calibrating a thickness measuring device and device for measuring or monitoring the thickness of layers, tapes, foils, and the like'1996Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1996–2013Patents assigned to MICRO EPSILON MESSTECHNIK (7)· patent assignee history
1996–2018Based in Ortenburg, DE· patent location history
1997Patents assigned to BUEHLER AG (1)· patent assignee history
2001Patents assigned to MICROEPSILON MESSTECHNIK GMBH (1)· patent assignee history
2008Patents assigned to HEIDELBERGER DRUCKMASCH AG (1)· patent assignee history
2018Patents assigned to MICRO EPSILON MESSTECHNIK GMBH & CO KG (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| MICRO EPSILON MESSTECHNIK | 7 | 1996–2013 |
| BUEHLER AG | 1 | 1997 |
| HEIDELBERGER DRUCKMASCH AG | 1 | 2008 |
| MICRO EPSILON MESSTECHNIK GMBH & CO KG | 1 | 2018 |
| MICROEPSILON MESSTECHNIK GMBH | 1 | 2001 |
Locations
| Location | Patents | Span |
|---|---|---|
| Ortenburg, DE | 12 | 1996–2018 |