Inventor
Kiyoshi Ogiwara
Inventor
Tokyo, JP
Overview
Patents· 1 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties50%
G01TMeasurement of nuclear or x-radiation50%
PatentTitleYear
9,958,563Radiation measurement method and device2018Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2018Patents assigned to HITACHI LTD (1)· patent assignee history
2018Patents assigned to OCHANOMZU UNIV (1)· patent assignee history
2018Patents assigned to UNIV OCHANOMIZU (1)· patent assignee history
2018Based in Tokyo, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI LTD | 1 | 2018 |
| OCHANOMZU UNIV | 1 | 2018 |
| UNIV OCHANOMIZU | 1 | 2018 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 1 | 2018 |